Park Young | School Of Electrical Engineering And Computer Science And Inter-university Of Semiconductor Research

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概要

• 同名の論文著者
• School Of Electrical Engineering And Computer Science And Inter-university Of Semiconductor Researchの論文著者

関連著者

• Min Hong

  School Of Electrical Engineering And Computer Science And Isrc Seoul National University

• Min Hong

  School Of Electrical Engineering & Isrc Seoul National University

• Park Young

  School Of Electrical Engineering And Computer Science And Inter-university Of Semiconductor Research

• Park Young

  School Of Mechanical Engineering Yonsei University

• Park Young

  School Of Electrical Engineering & Isrc Seoul National University

• Park Young

  School Of Electrical And Computer Engineering Sungkyunkwan University

• Lee Joo-hyoung

  Memory R&d Division Hynix Semiconductor Co.

• Lee J‐h

  Lg Electronics Inst. Technol. Seoul Kor

• Lee J‐h

  Wonkwang Univ. Chonpuk Kor

• Park Young

  Department Of Electronics Engineering And Inter University Semiconductor Research Center Seoul Natio

• Lee Hyeokjae

  School Of Electrical Engineering Kookmin University

• Lee Ju-Hyeon

  School of Electrical Engineering, Wonkwang University

• Park Y

  School Of Electrical Engineering & Isrc Seoul National University

• Lee Jong-ho

  School Of Electrical Engineering Wonkwang University

• Chung In-young

  School Of Electrical Engineering & Isrc Seoul National University

• Lee Jong-ho

  School Of Eecs Engineering Kyungpook National University

• Lee Jong-Ho

  School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea

• LEE Jong

  School of Electrical Engineering, Seoul National University

• Lee Jong

  School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.

• Chun Kwun-soo

  School Of Electrical Engineering And Computer Science Seoul National University

• Park Young-june

  School Of Electrical Engineering And Isrc Seoul National University

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著作論文

• Time-Varying Body Instability and Low-Frequency Noise Characteristics of Mini-Field-Dual-Body Silicon-on-Insulator Structure for Analog-Digital Mixed-Mode Circuits
• Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs
• AC Floating Body Effects and 1/f Noise Characteristics of Dual Body SOI Structure for Analog-Digital Mixed Mode Circuit
• A New Charge Pumping Device
• A New Charge Pumping Device

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