Lee Joo-hyoung | Memory R&d Division Hynix Semiconductor Co.
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概要
関連著者
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Lee Joo-hyoung
Memory R&d Division Hynix Semiconductor Co.
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Lee J‐h
Wonkwang Univ. Chonpuk Kor
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Lee J‐h
Lg Electronics Inst. Technol. Seoul Kor
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Lee Ju-Hyeon
School of Electrical Engineering, Wonkwang University
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Hwang Heuy-liang
Department Of Electrical Engineering Tsing-hua University
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LEE Jian-Hsing
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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Liew B‐k
Taiwan Semiconductor Manufacturuing Company
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Hwang Huey-liang
Department Of Electrical And Power Engineering National Tsing Hua University
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LEE Jian-Hsing
Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park
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SHIH Jiaw-Ren
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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LIEW Boon-Khim
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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HWANG Huey-Liang
Department of Electrical Engineering, Tsing-Hua University
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Park Chul-soon
Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun
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Liew Boon-khim
Taiwan Semiconductor Manufacturing Company R&d Device Department
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Park C‐s
Electronics And Telecommunications Res. Inst. Taejeon Kor
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YOON Hyung-Sup
Microwave Devices Team, ETRI
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Min Hong
School Of Electrical Engineering And Computer Science And Isrc Seoul National University
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Min Hong
School Of Electrical Engineering & Isrc Seoul National University
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Park Young
School Of Electrical Engineering And Computer Science And Inter-university Of Semiconductor Research
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Park Young
Department Of Electronics Engineering And Inter University Semiconductor Research Center Seoul Natio
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Lee Hyeokjae
School Of Electrical Engineering Kookmin University
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Shin Jiaw-Ren
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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LEE Hee
Department of Pharmacology, College of Medicine, Kohwang Medical Research Institute, Kyung Hee Unive
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Park S‐h
Magnachip Semiconductor Inc.
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LEE Key-Min
Memory R&D Division, Hynix Semiconductor Co.
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PARK Seong-Hyun
Memory R&D Division, Hynix Semiconductor Co.
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JANG Myoung-Jun
Memory R&D Division, Hynix Semiconductor Co.
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LEE Joo-Hyoung
Memory R&D Division, Hynix Semiconductor Co.
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YOON Ki-Seok
Memory R&D Division, Hynix Semiconductor Co.
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PARK Geun-Suk
Memory R&D Division, Hynix Semiconductor Co.
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KANG Keun-Koo
Department of Physics, Chungbuk Nataional University
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PARK Young-Jin
Memory R&D Division, Hynix Semiconductor Co.
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Kim J‐m
Department Of Manufacturing Science Graduate School Of Engineering Osaka University
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Park S‐h
Yonsei Univ. Seoul Kor
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Park S‐h
Hynix Semiconductor Choongbuk Kor
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Lee Hi-deok
R&d Division Lg Semicon Co. Ltd.
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Lee Hi-deok
Advanced Technology Laboratory Lg Semicon Co. Ltd.
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Lee Hi-deok
Advanced Technology Laboratory. Lg Semicon Co.
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Park Seong-hyun
Magnachip Semiconductor Inc.
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Hwang H‐l
Tsing‐hua Univ. Hsin‐chu Twn
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WU Yi-Hsun
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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Jang M‐j
Hynix Semiconductor Co. Choongbuk Kor
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Jang Myoung-jun
Memory R&d Division Hynix Semiconductor Co.
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Cho Jung-hoon
Memory R&d Division Hynix Semiconductor Co.
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Lee Key-min
Memory R&d Division Hynix Semiconductor Co.
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Park Geun-suk
Memory R&d Division Hynix Semiconductor Co.
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Park Young
Feram Team Memory R&d Division Hynix Semiconductor Incorporated
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Park Young-jin
Memory R&d Division Hynix Semiconductor Co.
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Kim Myoung-sup
Department Of Inorganic Materials Engineering Kyungpook National University
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Kim J‐m
Fed Project Samsung Advanced Institute Of Technology
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Jeon J‐h
Seoul National Univ. Seoul Kor
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Lee Hee
Department Of Chemistry Pohang University Of Science And Technology
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Jeon D
Korea Advanced Inst. Of Sci. And Technol. Daejeon Kor
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Jeon Duk
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Wu Yi-hsun
Taiwan Semiconductor Manufacturing Company R&d Device Department
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Lee Jong-ho
School Of Electrical Engineering Wonkwang University
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Kim Jong-min
Materials & Devices Lab. Samsung Advanced Institute Of Technology
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Kim Jong-min
Hyundai Electronics Industries Co. Ltd.
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Shih Jiaw-ren
Taiwan Semiconductor Manufacturing Company Reliability Assurance Department
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Pyun Kwang-eui
Compound Semiconductor Research Department Semiconductor Technology Division Electronics And Telecom
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JEON Jin-Ho
School of Physics, Seoul National University
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Jeon Jin-ho
School Of Physics Seoul National University
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Kang Keun-koo
Department Of Physics Chungbuk Nataional University
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Yoon Ki-seok
Memory R&d Division Hynix Semiconductor Co.
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CHO Sang-Hee
Department of Hematology/Oncology, Chonnam National University Hwasun Hospital
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Park Young
School Of Mechanical Engineering Yonsei University
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Chang Joon-sung
School Of Physics Seoul National University
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Kim Jae-jeong
Process Team R&d Division Lg Semicon Co Ltd.
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Park S‐h
Department Of Physics And Semiconductor Science Catholic University Of Daegu
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LEE Jin-Ho
Materials & Devices Lob., Sarnsung Advanced Institute of Technology
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CHOI Byoung-So
Materials & Devices Lob., Samsung Advanced Institute of Technology
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Kim M‐s
Electronics And Telecommunications Res. Inst. Daejeon Kor
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PARK Byung-Sun
Electronics and Telecommunications Research Institute
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LEE Joon-Hyung
Department of Inorganic Materials Engineering, Kynngpook National University
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KIM Jeong-Joo
Department of Inorganic Materials Engineering, Kynngpook National University
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Park Byung-sun
Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun
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Choi Hyun-tae
Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun
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Lee Ju-hyun
Department Of Veterinary Physiology College Of Veterinary Medicine And Bk21 Program For Veterinary S
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Lee H‐d
Chungnam National Univ. Taejon Kor
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LEE Jin-Hee
Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm
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YOON Hyung-Sup
Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm
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Chop Byoung-so
Materials & Devices Lab. Samsung Advanced Institute Of Technology
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Park Y‐j
Memory R&d Division Hynix Semiconductor Co.
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Cho Sung-hak
Electrotechnical Laboratory (etl)
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Ko Young-chul
Materials & Devices Lab. Samsung Advanced Institute Of Technology
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Park Young
School Of Electrical Engineering & Isrc Seoul National University
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Lee Jin-ho
Material Research And Development Laboratory Japan Fine Ceramics Center
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Cho Sang-hee
Department Of Hematology/oncology Chonnam National University Hwasun Hospital
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Ko Young-chul
Department Of Biomedical Laboratory Science College Of Biomedical Science And Engineering Inje Unive
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Jeon Duk
Department Of Materials Science And Engineering Korea Advanced Institute Of Science & Technology
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Lee Jong-ho
School Of Eecs Engineering Kyungpook National University
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Lee Hee
Department Of Materials Science And Engineering Yeungnam University
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Park Young
School Of Electrical And Computer Engineering Sungkyunkwan University
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Lee Hee
Department Of Anesthesiology And Pain Medicine Hanyang University College Of Medicine
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Liew Boon-Khim
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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Kim Jeong-Joo
Department of Electronic Materials Science and Engineering, Kyungpook National University, Daegu 702-701, Korea
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Lee Jong-Ho
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
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PARK Sung
Department of Material Science & Engineering, Gwangju Institute of Science and Technology
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Lee Hi-Deok
Dept. of Electronics Engineering, Chungnam National University
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Wu Yi-hong
Department Of Electrical Engineering Kyoto University:(present Address)department Of Electrical Engi
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LEE Jong
School of Electrical Engineering, Seoul National University
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JI Hee-Hwan
Department of Electronics Engineering, Chungnam National University
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LEE Hi-Deok
Department of Electronics Engineering, Chungnam National University
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BAE Mi-Suk
Department of Electronics Engineering, Chungnam National University
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CHO Jung-Hoon
Memory R&D Division, Hynix Semiconductor Co.
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Lee Hi-deok
Dept. Of Electronics Engineering Chungnam National Univ.
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Lee Jong
School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.
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LIAO Scott
Taiwan Semiconductor Manufacturing Company, Failure Analysis Department
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SHIUE Ruey-Yun
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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YUE John
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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CHEN Shui-Hung
Taiwan Semiconductor Manufacturing Company, R&D Device
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DIAZ Carlos-H
Taiwan Semiconductor Manufacturing Company, R&D Device
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Chaing Shang-Yi
Taiwan Semiconductor Manufacturing Company, R&D No.9, Creation Rd. I Science Based Industrial Park
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SHIH Jiaw-Ren
Department of Electrical Engineering, Tsing-Hua University
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LIEW B.
Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park
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Bae Mi-suk
Department Of Electronics Engineering Chungnam National University
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KANG Keun-Koo
Dept. of Physics, Chungbuk Nataional University
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CHOI Jung-Hoon
Memory R&D Division, Hynix Semiconductor Co.
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MOON Hee-Jong
Department of Optical Engineering, Sejong University
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LEE Jai-Hyung
School of Physics, Seoul National University
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KO Kwang-Hoon
Department of Physics and Condensed Matter Research Institute, Seoul National University
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KIM Guang-Hoon
Department of Physics and Condensed Matter Research Institute, Seoul National University
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LEE Jai-Hyung
Department of Physics and Condensed Matter Research Institute, Seoul National University
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CHANG Joon-Sung
Department of Physics and Condensed Matter Research Institute, Seoul National University
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Yue J
Taiwan Semiconductor Manufacturing Company Reliability Assurance Department:taiwan Semiconductor Man
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Park Sung-kun
Department Of Electronic Engineering Kyungpook National University
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Wang P
Shenyang Pharmtech Institute Of Pharmaceuticals
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Wang Peng
Department Of Clinical Laboratories Peking Union Medical College Hospital Chinese Academy Of Medical
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Liao Scott
Taiwan Semiconductor Manufacturing Company Failure Analysis Department
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Lee Jai-hyung
School Of Physics Seoul National University
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Diaz Carlos-h
Taiwan Semiconductor Manufacturing Company R&d Device
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Ko Kwang-hoon
Department Of Physics And Condensed Matter Research Institute Seoul National University
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Moon Hee-jong
Department Of Optical Engineering Sejong University
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Moon Hee-jong
Department Of Physics And Condensed Matter Research Institute Seoul National University
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Oh Myoung-kyu
School Of Physics Seoul National University
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Chen Shui-hung
Taiwan Semiconductor Manufacturing Company R&d Device
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Shiue Ruey-yun
Taiwan Semiconductor Manufacturing Company Reliability Assurance Department
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Kim Guang-hoon
Department Of Physics And Condensed Matter Research Institute Seoul National University
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Pyun Kwang-eui
Compound Semicnductor Research Department Electronics And Telecommunications Research Instiute
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LEE Won-Kyu
School of Physics, Seoul National University
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CHOI Won-Shik
School of Physics, Seoul National University
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CHANG Joon-Sung
School of Physics, Seoul National University
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Lee Won-kyu
School Of Physics Seoul National University
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Choi Won-shik
School Of Physics Seoul National University
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Park Hyung-Moo
Semiconductor Div., Electronics and Telecommunications Research Institute
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LEE Ju-Hyeon
Electronic Thin Film Lab., Department of Materials Science and Engineering, Sun Moon University
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JUNG Il-Chae
Electronic Thin Film Lab., Department of Materials Science and Engineering, Sun Moon University
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PARK Sang-Kook
Electronic Thin Film Lab., Department of Materials Science and Engineering, Sun Moon University
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BAEK Cheong-A
Electronic Thin Film Lab., Department of Materials Science and Engineering, Sun Moon University
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Park Hyung-moo
Semiconductor Div. Electronics And Telecommunications Research Institute
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Park Hyung-moo
Semiconductor Division Electronics And Telecommunications Research Institute
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KO Young-Chu
Materials & Devices Lob., Samsung Advanced Institute of Technology
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MUN Yong-Kweun
Materials & Devices Lob., Samsung Advanced Institute of Technology
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KO Young-Chul
Materials & Devices Lab., Samsung Advanced institute of Technology
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CHOP Byoung-So
Materials & Devices Lab., Samsung Advanced institute of Technology
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Park Seong-hyung
Lg Semicon. Ltd.
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Park S‐k
Korea Electronics Technol. Inst. Kyunggi Kor
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Chaing Shang-yi
Taiwan Semiconductor Manufacturing Company R&d No.9 Creation Rd. I Science Based Industrial Park
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JEON Jin-Ho
Department of Physics and Condensed Matter Research Institute, Seoul National University
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NOH Young-Chul
Department of Physics and Condensed Matter Research Institute, Seoul National University
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MEANG Sung-Jae
Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm
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LEE Chul-Wook
Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm
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YUN Chan-Eui
Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm
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YOON Hyung-Sup
Semiconductor Division, Electronics and Telecommunications Research Institute
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LEE Jin-Hee
Semiconductor Division, Electronics and Telecommunications Research Institute
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PARK Chul-Soon
Semiconductor Division, Electronics and Telecommunications Research Institute
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PYUN Kwang-Eui
Semiconductor Division, Electronics and Telecommunications Research Institute
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Chun Kwun-soo
School Of Electrical Engineering And Computer Science Seoul National University
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Park Young-june
School Of Electrical Engineering And Isrc Seoul National University
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Noh Young-chul
Department Of Physics And Condensed Matter Research Institute Seoul National University
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Yun Chan-eui
Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun
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Jung Il-chae
Electronic Thin Film Lab. Department Of Materials Science And Engineering Sun Moon University
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Lee Chul-wook
Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun
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Baek Cheong-a
Electronic Thin Film Lab. Department Of Materials Science And Engineering Sun Moon University
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Meang Sung-jae
Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun
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Park Sang-kook
Electronic Thin Film Lab. Department Of Materials Science And Engineering Sun Moon University
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Mun Yong-kweun
Materials & Devices Lob. Samsung Advanced Institute Of Technology
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Ji Hee-hwan
Department Of Electronics Engineering Chungnam National University
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Park Sung
Department Of Anesthesia And Pain Medicine School Of Medicine Pusan National University
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Lee Ju-hyeon
Electronic Thin Film Lab. Department Of Materials Science And Engineering Sun Moon University
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Hwang Heuy-liang
Department Of Electrical Engineering National Tsing Hua University
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WU Yi-Hsun
Taiwan Semiconductor Manufacturing Company, R&D Device
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SHIH Jiaw-Ren
Department of Electrical Engineering, Tsing-Hua University:Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park
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SHIH Jiaw-Ren
Taiwan Semiconductor Manufacturing Company, R&D Device
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LEE Jian-Hsing
Taiwan Semiconductor Manufacturing Company, R&D Device
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Lee Won-Kyu
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Lee Won-Kyu
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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CHEN Shui-Hung
Taiwan Semiconductor Manufacturing Company, R&D Device
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DIAZ Carlos-H
Taiwan Semiconductor Manufacturing Company, R&D Device
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Chang Joon-Sung
Department of Physics and Condensed Matter Research Institute,
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LIEW B.
Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park
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Lee Jai-Hyung
Department of Physics and Condensed Matter Research Institute,
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LEE Jai-Hyung
School of Physics and Astronomy, Seoul National University
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Shin Jiaw-Ren
Department of Electrical Engineering, Tsing-Hua University
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Liew B.K.
Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park
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WANG Peng
Department of Bioengineering, Nanjing University of Science and Technology
著作論文
- Characterization of the Co-Silicide Penetration Depth into the Junction Area for 0.15 and Sub-0.15 Micron CMOS Technology
- The Mechanism Responsible for a Low Electrostatic Discharge Failure Threshold of an Output Buffer Circuit with Low Current Drive Capability
- The Method to Optimize Gate Oxide Integrity, Hot Carrier Effect and Electro-Static Discharge without Sacrificing the Performance in Sub-Quarter Micron Dual Gate Oxide Process
- Analytical Model of Human Body Model Electrostatic Discharge Current Distribution and Novel Electrostatic Discharge Protection Structure
- A Novel Thin Gate-Oxide-Thickness Measurement Method by LDD (Lightly-Doped-Drain)-NMOS (N-Channel Metal-Oxide-Semiconductor) Transistors
- Characterization of the Co-Silicide Penetration Depth into the Junction Area
- Self-Induced Transparency in Samarium Atomic Vapor under Condition of High Temperature and High Density
- Effect of Microwave Pulse on the Optical Properties of Hydrogenated Amorphous Silicon Thin Films Deposited by Electron Cyclotron Resonance Plasma
- Laser Graphic Video Display using Silicon Scanning Mirrors with Vertical Comb Fingers
- Characterization of Silicon Scanning Mirror for Laser Display
- Origin of Abnormal Grain Growth in Tungsten Bronze Structured Ferroelectric Sr_xBa_Nb_2O_6 Ceramics
- Site Occupancy and Dielectric Characteristics of Strontium Barium Niobate Ceramics : Sr/Ba Ratio Dependence
- Ring Dark Solitary Waves on a Gaussian Background Beam
- Noise Performance of Pseudomorphic AlGaAs/InGaAs/GaAs High Electron Mobility Transistors with Wide Head T-Shaped Gate Recessed by Electron Cyclotron Resonance Plasma Etching
- Extremely Low Noise 0.15μm T-Gate AlGaAs/InGaAs Pseudomorphic HEMTs
- Low Noise Characteristics of 0.2μm Al_Ga_As/In_Ga_As/GaAs Pseudomorphic HEMTs with Wide Head T-Shaped Multifinger Gate
- Time-Varying Body Instability and Low-Frequency Noise Characteristics of Mini-Field-Dual-Body Silicon-on-Insulator Structure for Analog-Digital Mixed-Mode Circuits
- Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs
- AC Floating Body Effects and 1/f Noise Characteristics of Dual Body SOI Structure for Analog-Digital Mixed Mode Circuit