Park Young-jin | Memory R&d Division Hynix Semiconductor Co.
スポンサーリンク
概要
関連著者
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Park Young-jin
Memory R&d Division Hynix Semiconductor Co.
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Lee S‐s
Memory Research And Development Division Hynix Semiconductor Inc.
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Kang Hee-bok
Memory Research And Development Division Hynix Semiconductor Inc.
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Hong Suk-Kyoung
Memory Research and Development Division, Hynix Semiconductor Inc.
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Park Y‐j
Memory Research And Development Division Hynix Semiconductor Inc.
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Kim Chang-shuk
Memory Research And Development Division Hynix Semiconductor Inc.
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Lee Kye-nam
Memory Research And Development Division Hynix Semiconductor Inc.
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Noh Kunm-hwan
Memory Research And Development Division Hynix Semiconductor Inc.
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Lee Seaung-Suk
Memory Research and Development Division, Hynix Semiconductor Inc.
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Jang In-Woo
Memory Research and Development Division, Hynix Semiconductor Inc.
著作論文
- Characterization of the Co-Silicide Penetration Depth into the Junction Area for 0.15 and Sub-0.15 Micron CMOS Technology
- Characterization of the Co-Silicide Penetration Depth into the Junction Area
- Device Characteristics and Reliability of Thin Gate Dielectrics Grown by Light Wet Oxynitridation(LWO)
- Invited Status and Future of Emerging Nonvolatile Memories (先端デバイスの基礎と応用に関するアジアワークショップ)
- [Invited] Status and Future of Emerging Nonvolatile Memories (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))
- Status and Future of Emerging Nonvolatile Memories
- Status and Future of Emerging Nonvolatile Memories