SHIH Jiaw-Ren | Department of Electrical Engineering, Tsing-Hua University:Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park

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概要

• 同名の論文著者
• Department of Electrical Engineering, Tsing-Hua University:Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Parkの論文著者

関連著者

• Hwang Heuy-liang

  Department Of Electrical Engineering Tsing-hua University

• LEE Jian-Hsing

  Taiwan Semiconductor Manufacturing Company, R&D Device Department

• HWANG Huey-Liang

  Department of Electrical Engineering, Tsing-Hua University

• SHIH Jiaw-Ren

  Department of Electrical Engineering, Tsing-Hua University

• LIEW B.

  Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park

• Lee Joo-hyoung

  Memory R&d Division Hynix Semiconductor Co.

• Liew B‐k

  Taiwan Semiconductor Manufacturuing Company

• Lee J‐h

  Wonkwang Univ. Chonpuk Kor

• Hwang Huey-liang

  Department Of Electrical And Power Engineering National Tsing Hua University

• SHIH Jiaw-Ren

  Department of Electrical Engineering, Tsing-Hua University:Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park

• LEE Jian-Hsing

  Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park

• LIEW B.

  Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park

• Shin Jiaw-Ren

  Department of Electrical Engineering, Tsing-Hua University

• Liew B.K.

  Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park

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著作論文

• A Novel Thin Gate-Oxide-Thickness Measurement Method by LDD (Lightly-Doped-Drain)-NMOS (N-Channel Metal-Oxide-Semiconductor) Transistors

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