HWANG Huey-Liang | Department of Electrical Engineering, Tsing-Hua University

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著作論文

The Mechanism Responsible for a Low Electrostatic Discharge Failure Threshold of an Output Buffer Circuit with Low Current Drive Capability
The Method to Optimize Gate Oxide Integrity, Hot Carrier Effect and Electro-Static Discharge without Sacrificing the Performance in Sub-Quarter Micron Dual Gate Oxide Process
A Novel Thin Gate-Oxide-Thickness Measurement Method by LDD (Lightly-Doped-Drain)-NMOS (N-Channel Metal-Oxide-Semiconductor) Transistors
Very Low Temperature Deposition of Polycrystalline Si Films Fabricated by Hydrogen Dilution with Electron Cyclotron Resonance Chemical Vapor Deposition
Thin Film Transistors Made from Hydrogenated Microcrystalline Silicon
Ion Implanted Grating Type Si Solar Cells : B-6: SOLAR CELLS AND AMORPHOUS DEVICES
Thermodynamic Considerations of Vapor Epitaxial Growth of CuInS_2/GaP heterojunctions : CHALCOPYRITES : THIN FILMS AND JUNCTIONS

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