Wu Yi-hong | Department Of Electrical Engineering Kyoto University:(present Address)department Of Electrical Engi
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- 同名の論文著者
- Department Of Electrical Engineering Kyoto University:(present Address)department Of Electrical Engiの論文著者
関連著者
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Wu Yi-hong
Department Of Electrical Engineering Kyoto University:(present Address)department Of Electrical Engi
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Wu Yi-hsun
Taiwan Semiconductor Manufacturing Company R&d Device Department
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Wu Y‐h
Taiwan Semiconductor Manufacturing Co. Hsin‐chu Twn
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Fujita Shizuo
Department Of Electronic Science And Engineering Kyoto University
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KAWAKAMI Yoichi
Department of Electrical Engineering Kyoto University
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FUJITA Shigeo
Department of Electrical Engineering Kyoto University
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Fujita Shigeo
Department Of Applied Physics And Physico-informatics Keio University
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Kawakami Y
Kyoto Univ. Kyoto Jpn
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Kawakami Y
Ntt Corp. Yokosuka‐shi Jpn
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Kawakami Yoichi
Department Of Electrical Engineering Faculty Of Engineering Osaka University
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Fujita Shizuo
Department Of Electrical Engineering Kyoto University
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Fujita Shiz
Kyoto Univ. Kyoto Jpn
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Fujita Shigetaka
Department Of Electrical And Electronic Engineering Faculty Of Engineering Hachinohe Institute Of Te
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藤田 茂夫
京都大学大学院工学研究科電子工学
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ICHINO Kunio
Department of Electrical Engineering Kyoto University
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Ichino Kunio
Department Of Electrical Enginnering Kyoto Unviersity
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Ichino K
Department Of Electrical And Electronic Engineering Tottori University
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Ichino Kunio
Department Of Electrical And Electronic Engineering Faculty Of Engineering Tottori University
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TOYODA Takashi
Department of Electrical Engineering, Kyoto University
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Toyoda Takashi
Department Of Electrical Engineering Kyoto University
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Toyoda Takashi
Semiconductor Research Laboratory Mitsubishi Electric Corporations
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Toyoda T
Univ. Electro‐communications Tokyo Jpn
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Toyoda Takeshi
Materials And Structures Laboratory Tokyo Institute Of Technology
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TOYODA Takashi
Department of Applied Physics and Chemistry, The University of Electro-Communications
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HSU Wei-Chou
Department of Electrical Engineering, National Cheng-Kung University
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Hsu W‐c
National Cheng‐kung Univ. Tainan Twn
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Liu W‐c
National Cheng‐kung Univ. Tainan Twn
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Liu Wen-chau
Institute Of Microelectronics Department Of Electrical Engineering National Cheng-kung University
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Hsu Wei-chou
Department Of Electrical Engineering National Cheng Kung University
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WU Yu-Huei
Department of Electrical Engineering, National Cheng Kung University
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SU Jan-Shing
Department of Electrical Engineering, National Cheng Kung University
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LIN Wei
Photonic Technology Research, Telecommunication Lab., Ministry of Transportation and Communication
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Hsu Wei-cheng
Materials Research Laboratory
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Su Jan-shing
Department Of Electrical Engineering National Cheng Kung University
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Lin Wei
Photonic Technology Research Telecommunication Laboratories Chunghwa Telecom Co. Ltd.
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Liu Wen-Chau
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University
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LIU Wen-Chau
Department of Electrical Engineering, National Cheng-Kung University
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山口 滋
Department Of Physics School Of Science Tokai University
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OHNAKADO Takahiro
Department of Electrical Engineering, Kyoto University
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Yamaguchi Shigeo
Department of Electrical Engineering, Kyoto University
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Hwang H‐l
Tsing‐hua Univ. Hsin‐chu Twn
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Hwang Heuy-liang
Department Of Electrical Engineering Tsing-hua University
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SHIH Jiaw-Ren
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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LEE Jian-Hsing
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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WU Yi-Hsun
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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LIAO Scott
Taiwan Semiconductor Manufacturing Company, Failure Analysis Department
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LIEW Boon-Khim
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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SHIUE Ruey-Yun
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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HWANG Huey-Liang
Department of Electrical Engineering, Tsing-Hua University
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YUE John
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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Lee Joo-hyoung
Memory R&d Division Hynix Semiconductor Co.
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Yue J
Taiwan Semiconductor Manufacturing Company Reliability Assurance Department:taiwan Semiconductor Man
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Liao Scott
Taiwan Semiconductor Manufacturing Company Failure Analysis Department
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Liu Wen-chau
Department Of Electrical Engineering National Cheng Kung University
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Shih Jiaw-ren
Taiwan Semiconductor Manufacturing Company Reliability Assurance Department
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Lee J‐h
Lg Electronics Inst. Technol. Seoul Kor
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Liew Boon-khim
Taiwan Semiconductor Manufacturing Company R&d Device Department
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Liew B‐k
Taiwan Semiconductor Manufacturuing Company
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Shiue Ruey-yun
Taiwan Semiconductor Manufacturing Company Reliability Assurance Department
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Lee J‐h
Wonkwang Univ. Chonpuk Kor
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Hsu Rong-tay
Department Of Electrical Engineering National Cheng Kung University
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KAO Ming-Jer
Department of Electrical Engineering, National Cheng Kung University
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Hwang Huey-liang
Department Of Electrical And Power Engineering National Tsing Hua University
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Ohnakado Takahiro
Department Of Electrical Engineering Kyoto University
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Kao Ming-jer
Department Of Electrical Engineering National Cheng Kung University
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LIN Yu-Shyan
Department of Electrical Engineering, National Cheng Kung University
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HO Shing-Dong
Department of Electrical Engineering, National Cheng Kung University
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Lin Y‐s
National Cheng Kung Univ. Tainan Twn
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Ho Shing-dong
Department Of Electrical Engineering National Cheng Kung University
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Yamaguchi Shigeo
Department Of Electrical Electronic And Information Engineering Kanagawa University:energy Electroni
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Shin Jiaw-Ren
Taiwan Semiconductor Manufacturing Company, Reliability Assurance Department
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Liew Boon-Khim
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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LEE Jian-Hsing
Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park
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Lee Ju-Hyeon
School of Electrical Engineering, Wonkwang University
著作論文
- Optical Properties of ZnCdSe/ZnSSe Strained-Layer Quantum Wells
- Estimation of Critical Thicknesses and Band Lineups in ZnCdSe/ZnSSe Strained-Layer System for Design of Carrier Confinement Quantum Well Structures
- Metalorganic Molecular Beam Epitaxy of Zn_Cd_xS_ySe_ Quaternary Alloys on GaAs Substrate
- On the Properties of ZnSe/(NH_4)_2S_x-Pretreated GaAs Heterointerfaces
- Optically Pumped Blue-Green Laser Operation Above Room-Temperature in Zn_Cd_Se-ZnS_Se_ Multiple Quantum Well Structures Grown by Metalorganic Molecular Beam Epitaxy
- Growth and Optical Properties of Novel Wide-Band-Gap Strained-Layer Single Quantum Wells: Zn_Cd_ySe/ZnS_xSe_
- Growth of Short-Period ZnSe-ZnS_xSe_ Strained-Layer Superlattices by Metalorganic Molecular Beam Epitaxy
- Effect of Hydrogen on Pseudomorphic ZnSe onto GaAs by the Alternate Gas Supply of Dimethylzinc and Dimethylselenide in the MOMBE System
- Effects of (NH_4)_2S_x-Pretreatment of GaAs Surfaces on Properties of Epilayers and Heterointerfaces in Pseudomorphic ZnSe/GaAs Gown by MOMBE
- Atomic Layer Epitaxy of ZnS on GaAs Substrates by Metalorganic Molecular Beam Epitaxy
- Metalorganic Molecular Beam Epitaxial Growth of ZnSe and ZnS on GaAs Substrates Pretreated with (NH_4)_2S_x Solution
- The Mechanism Responsible for a Low Electrostatic Discharge Failure Threshold of an Output Buffer Circuit with Low Current Drive Capability
- Emitter Edge-Thinning Effect on InGaAs/InP Double-Heterostructure-Emitter Bipolar Transistor
- An Improved In_Ga_P/GaAs Double Heterostructure-Emitter Bipolar Transistor Using Emitter Edge-Thinning Technique