MEANG Sung-Jae | Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm

スポンサーリンク

概要

• 同名の論文著者
• Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecommの論文著者

関連著者

• Lee Joo-hyoung

  Memory R&d Division Hynix Semiconductor Co.

• Park Chul-soon

  Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun

• Lee J‐h

  Lg Electronics Inst. Technol. Seoul Kor

• Lee J‐h

  Wonkwang Univ. Chonpuk Kor

• Park C‐s

  Electronics And Telecommunications Res. Inst. Taejeon Kor

• PARK Byung-Sun

  Electronics and Telecommunications Research Institute

• Park Byung-sun

  Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun

• Choi Hyun-tae

  Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun

• YOON Hyung-Sup

  Microwave Devices Team, ETRI

• LEE Jin-Hee

  Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm

• YOON Hyung-Sup

  Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm

• MEANG Sung-Jae

  Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm

• LEE Chul-Wook

  Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm

• YUN Chan-Eui

  Compound Semiconductor Department, Micro-Electronics Technology Laboratory, Electronics and Telecomm

• Yun Chan-eui

  Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun

• Lee Chul-wook

  Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun

• Meang Sung-jae

  Compound Semiconductor Department Micro-electronics Technology Laboratory Electronics And Telecommun

• Lee Ju-Hyeon

  School of Electrical Engineering, Wonkwang University

もっと見る 閉じる

著作論文

• Noise Performance of Pseudomorphic AlGaAs/InGaAs/GaAs High Electron Mobility Transistors with Wide Head T-Shaped Gate Recessed by Electron Cyclotron Resonance Plasma Etching

スポンサーリンク