Choi SeongWook | School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-744, Korea

スポンサーリンク

概要

関連著者

Park Young
School Of Electrical And Computer Engineering Sungkyunkwan University
Baek Chang-Ki
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea
Choi SeongWook
School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-744, Korea
Park Sooyoung
School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-744, Korea

著作論文

An Analysis of the Field Dependence of Interface Trap Generation under Negative Bias Temperature Instability Stress using Wentzel--Kramers--Brillouin with Density Gradient Method

スポンサーリンク