ORS-08 ROBUST H_∞ LOOP-SHAPING DESIGN FOR AN OPTICAL DISK DRIVE SYSTEM
スポンサーリンク
概要
- 論文の詳細を見る
This paper deals with the robust control using H_<∝> loop-shaping for an optical disk drives (ODD). The shape factor used in this process is a firmware servo loop and the robust H_<∝> loop-shaping controller using this shape factor is designed, then it is applied to a commercial optical disk drives. A shaping factor to open loop is critical factor in the design process, therefore, we should consider what is desirable loop shape and the disturbance characteristics. Based on our previous work about the disturbance characteristics [1], a controller design considering these characteristics can be done.
- 一般社団法人日本機械学会の論文
著者
-
Park No
School Of Mechanical Engineering Yonsei University
-
Yang Hyunseok
School Of Mechanical Engineering Yonsei University
-
Park Young
School Of Mechanical Engineering Yonsei University
-
CHOI Jin
Interdisciplinary Course of Information Storage Engineering, School of Engineering, Yonsei Universit
-
JUN Hong
DST Group, Digital Media Research Lab., LG Electronics
-
YANG Hyun
School of Mechanical Engineering, Yonsei University
-
Jun Hong
Dst Group Digital Media Research Lab. Lg Electronics
-
Park Young
School Of Electrical Engineering & Isrc Seoul National University
-
Choi Jin
Interdisciplinary Course Of Information Storage Engineering School Of Engineering Yonsei University
-
Park Young
School Of Electrical And Computer Engineering Sungkyunkwan University
関連論文
- ORS-08 ROBUST H_∞ LOOP-SHAPING DESIGN FOR AN OPTICAL DISK DRIVE SYSTEM
- Design Technique for Ramped Gate Soft-Programming in Over-Erased NOR Type Flash EEPROM Cells
- High Speed, Low Power Programming in 0.17μm Channel Length NOR-type Floating Gate Flash Memory Cell Free of Drain Turn-On Effects
- Pt and RuO_2 Bottom Electrode Effects on Pb(Zr,Ti)O_3 Memory Capacitors
- Time-Varying Body Instability and Low-Frequency Noise Characteristics of Mini-Field-Dual-Body Silicon-on-Insulator Structure for Analog-Digital Mixed-Mode Circuits
- Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs
- A New Charge Pumping Device
- A New Charge Pumping Device
- An Analysis of the Field Dependence of Interface Trap Generation under Negative Bias Temperature Instability Stress using Wentzel--Kramers--Brillouin with Density Gradient Method
- Inductively Coupled Plasma Etching of Chemical-Vapor-Deposited Amorphous Carbon in N2/O2/Ar Chemistries
- DISTURBANCE MEASUREMENT OF OPTICAL DISC AND SERVO LOOP DESIGN RELATED TO ITS RESULT
- Spatial Distribution of Oxide Traps in Stressed Flash Memory
- Application of Solid Immersion Lens-Based Near-Field Recording Technology to High-Speed Plasmonic Nanolithography
- New Multiple-Times Programmable CMOS ROM Cell
- Novel Pull-In Process Using Input Shaping for Solid Immersion Lens-Based Near-Field Recording System
- Design Technique for Ramped Gate Soft-Programming in Over-Erased NOR Type Flash EEPROM Cells
- High Speed, Low Power Programming in 0.17μm Channel Length NOR-type Floating Gate Flash Memory Cell Free of Drain Turn-On Effects
- Spatial Distribution of Oxide Traps in Stressed Flash Memory