A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint

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概要

• 論文の詳細を見る
• 2003-12-01

著者

• Fujiwara Hideo

  Graduate School Of Information Science Nara Institute Of Science And Technology

• Fujiwara Hideo

  The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Techno

• Date Hiroshi

  Starc

• Fujiwara Hideo

  Naist

• Fujiwara Hideo

  Graduate School Of Infromation Science Nara Institute Of Science And Technology (naist)

• Fujiwara Hideo

  Nara Institute Of Science And Technology

• MURAOKA Michiaki

  STARC

• HOSOKAWA Toshinori

  College of Industrial Technology, Nihon University

• DATE Hiroshi

  System JD Co., Ltd.

• MIYAZAKI Masahide

  Design Technology Development Department, Semiconductor Technology Academic Research Center (STARC)

• MURAOKA Michiaki

  Design Technology Development Department, Semiconductor Technology Academic Research Center (STARC)

• Fujiwara Hideo

  Graduate School Of Information Of Science Nara Institute Of Science And Technology

• Fujiwara H

  Nara Inst. Sci. And Technol. Kansai Science City Jpn

• Hosokawa T

  Starc

• Hosokawa Toshinori

  College Of Industrial Technology Nihon University

• Muraoka M

  Starc (semiconductor Technol. Academic Res. Center) Yokohama‐shi Jpn

• Miyazaki Masahide

  Design Technology Development Department Semiconductor Technology Academic Research Center (starc)

関連論文

• Classification of Sequential Circuits Based on τ^k Notation and Its Applications(VLSI Systems)
• Fault-Tolerant and Self-Stabilizing Protocols Using an Unreliable Failure Detector
• F-Scan: A DFT Method for Functional Scan at RTL
• Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• On the Effect of Scheduling in Test Generation
• Testing for the Programming Circuit of SRAM-Based FPGAs
• Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on τ^k-Notation(Complexity Theory)
• Reduction in Over-Testing of Delay Faults through False Paths Identification Using RTL Information
• A DFT Selection Method for Reducing Test Application Time of System-on-Chips(SoC Testing)(Test and Verification of VLSI)
• A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint(Test)(Dependable Computing)
• A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint
• Design for Two-Pattern Testability of Controller-Data Path Circuits
• Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• Analyzing Path Delay Fault Testability of RTL Data Paths: A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency
• NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints
• On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time
• Scheduling Power-Constrained Tests through the SoC Functional Bus
• NoC Wrapper Optimization under Channel Bandwidth and Test Time Constraints
• Power-Conscious Microprocessor-Based Testing of System-on-Chip
• Power-Conscious Microprocessor-Based Testing of System-on-Chip(テスト,システム設計及び一般)
• Delay Fault Testing of Processor Cores in Functional Mode(Dependable Computing)
• A Test Generation Framework using Checker Circuits and its Application to Path Delay Test Generation
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• Equivalence of Sequential Transition Test Generation and Constrained Combinational Stuck-at Test Generation
• A Design Scheme for Delay Testing of Controllers Using State Transition Information
• Wait-Free Linearizable Distributed Shared Memory
• Parallel Algorithms for the All Nearest Neighbors of Binary Image on the BSP Model
• High-Level Synthesis for Weakly Testable Data Paths(Special Issue on Test and Diagnosis of VLSI)
• A Simple Parallel Algorithm for the Medial Axis Transform (Special Issue on Architectures Algorithms and Networks for Massively parallel Computing)
• Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (システムLSI設計技術・デザインガイア2007--VLSI設計の新しい大地を考える研究会)
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (ディペンダブルコンピューティング)
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (VLSI設計技術)
• Power constrained IP core wrapper design with partitioned clock domains (回路とシステム)
• Power constrained IP core wrapper design with partitioned clock domains (VLSI設計技術)
• Power constrained IP core wrapper design with partitioned clock domains (信号処理)
• A Test State Reduction Method for FSMs with Non-Scan DFT Using Don't Care Inputs Identification Technique (特集:システムLSIの設計技術と設計自動化)
• Two Test Generation Methods Using a Compacted Test Table and a Compacted Test Plan Table for RTL Data Path Circuits(Special Issue on Test and Verification of VLSI)
• Performance Analysis of Parallel Test Generation for Combinational Circuits
• Optimal Granularity of Parallel Test Generation on the Client-Agent-Server Model
• A New Class of Sequential Circuits with Combinational Test Generation Complexity for Path Delay Faults
• SPIRIT:A High Robust Combinational Test Generation Algorithm (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• Design for Hierarchical Two-Pattern Testability of Data Paths
• A Self-Stabilizing Spanning Tree Protocol that Tolerates Non-quiescent Permanent Faults
• A DFT Method for Core-Based Systems-on-a-Chip Based on Consecutive Testability
• A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
• Classification of Sequential Circuits Based on Combinational Test Generation Complexity
• A Non-scan DFT Method at Register-Transfer Level to Achieve 100% Fault Efficiency (特集:システムLSIの設計技術と設計自動化)
• Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths(Dependable Computing)
• F-Scan : A DFT Method for Functional Scan at RTL
• A Low Power Deterministic Test Using Scan Chain Disable Technique
• A secure scan design approach using extended de Bruijn graph (ディペンダブルコンピューティング)
• A New Data Structure for SAT-Based Static Learning With Impact on Test Generation (特集 新アーキテクチャLSI技術および一般)
• Non-scan Design for Testability for Synchronous Sequential Circuits Based on Fault-Oriented Conflict Analysis(Fault Tolerance)
• Non-scan Design for Testability for Synchronous Sequential Circuits Based on Fault-Oriented Conflict Analysis
• A Method of Path Mapping from RTL to Gate Level and Its Application to False Path Identification
• Differential Behavior Equivalent Classes of Shift Register Equivalents for Secure and Testable Scan Design
• A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution

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