A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution

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概要

• 論文の詳細を見る

• In recent years, the growing density and complexity of VLSIs have led to an increase in the numbers of test patterns and fault models. Test patterns used in VLSI testing are required to provide high quality and low cost. Don't care (X) identification techniques and X-filling techniques are methods to satisfy these requirements. However, conventional X-identification techniques are less effective for application-specific fields such as test compaction because the X-bits concentrate on particular primary inputs and pseudo primary inputs. In this paper, we propose a don't care identification method for test compaction. The experimental results for ITC'99 and ISCAS'89 benchmark circuits show that a given test set can be efficiently compacted by the proposed method.

• The Institute of Electronics, Information and Communication Engineersの論文

著者

• Hosokawa Toshinori

  College Of Industrial Technology Nihon University

• Yamazaki Hiroshi

  Graduate Course Of Electrical Engineering Tokyo Metropolitan University

• YOSHIMURA Masayoshi

  Department of Computer Science and Communication Engineering, Kyushu University

• Yoshimura Masayoshi

  Department of Advanced Information Technology, Graduate School of Information Science and Electrical Engineering, Kyushu University

• WAKAZONO Motohiro

  Graduate School of Industrial Technology, Nihon University

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