Hosokawa Toshinori | College Of Industrial Technology Nihon University

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概要

• HOSOKAWA Toshinoriの詳細を見る
• 同名の論文著者
• College Of Industrial Technology Nihon Universityの論文著者

関連著者

• Hosokawa Toshinori

  College Of Industrial Technology Nihon University

• Fujiwara Hideo

  Graduate School Of Information Science Nara Institute Of Science And Technology

• HOSOKAWA Toshinori

  College of Industrial Technology, Nihon University

• Fujiwara Hideo

  Graduate School Of Information Of Science Nara Institute Of Science And Technology

• Fujiwara Hideo

  The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Techno

• Date Hiroshi

  Starc

• Fujiwara Hideo

  Naist

• Fujiwara Hideo

  Graduate School Of Infromation Science Nara Institute Of Science And Technology (naist)

• Fujiwara Hideo

  Nara Institute Of Science And Technology

• MURAOKA Michiaki

  STARC

• DATE Hiroshi

  System JD Co., Ltd.

• MIYAZAKI Masahide

  Design Technology Development Department, Semiconductor Technology Academic Research Center (STARC)

• MURAOKA Michiaki

  Design Technology Development Department, Semiconductor Technology Academic Research Center (STARC)

• Fujiwara H

  Nara Inst. Sci. And Technol. Kansai Science City Jpn

• Hosokawa T

  Starc

• Muraoka M

  Starc (semiconductor Technol. Academic Res. Center) Yokohama‐shi Jpn

• Miyazaki Masahide

  Design Technology Development Department Semiconductor Technology Academic Research Center (starc)

• Inoue Ryoichi

  Graduate School Of Industrial Technology Nihon University

• Fujiwara Hideo

  Graduate School Of Information Science Nara Institute Of Science And Technology (naist)

• Yamazaki Hiroshi

  Graduate Course Of Electrical Engineering Tokyo Metropolitan University

• YOSHIMURA Masayoshi

  Department of Computer Science and Communication Engineering, Kyushu University

• Yoshimura Masayoshi

  Department of Advanced Information Technology, Graduate School of Information Science and Electrical Engineering, Kyushu University

• WAKAZONO Motohiro

  Graduate School of Industrial Technology, Nihon University

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著作論文

• A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint(Test)(Dependable Computing)
• A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint
• A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
• A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution

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