Classification of Sequential Circuits Based on Combinational Test Generation Complexity
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概要
- 論文の詳細を見る
In this paper, we introduce a new test generation notation called τ^k notation, which consists of τ^k-equivalent and τ^k-bounded, in order to clarify the classification of sequential circuits based on combinational test generation complexity. We reconsider the test generation complexity for the existing classes of acyclic sequential circuits. We also propose FSR scan design technique as a DFT method and examine the test generation complexity for the augmented circuits. Three classes of sequential circuits that cover some cyclic sequential circuits have been identified as being T-equivalent and τ^k-bounded.
- 社団法人電子情報通信学会の論文
- 2004-02-13
著者
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Fujiwara Hideo
Graduate School Of Information Science Nara Institute Of Science And Technology
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Ooi Chia
Graduate School Of Information Science Nara Institute Of Science And Technology Kansai Science City
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Fujiwara Hideo
Graduate School Of Information Of Science Nara Institute Of Science And Technology
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Fujiwara Hideo
Graduate School Of Information Science Nara Institute Of Science And Technology Kansai Science City
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藤原 秀雄
Graduate School of Information Science, Nara Institute of Science and Technology Kansai Science City
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