Classification of Sequential Circuits Based on τ^k Notation and Its Applications(VLSI Systems)

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概要

• 論文の詳細を見る

• This paper introduces τ^k notation to be used to assess test generation complexity of classes of sequential circuits. Using τ^k notation, we reconsider and restate the time complexity of test generation for existing classes of acyclic sequential circuits. We also introduce a new DFT method called feedback shift register (FSR) scan design technique, which is extended from the scan design technique. Therefore, for a given sequential circuit, the corresponding FSR scan designed circuit has always equal or lower area overhead and test application time than the corresponding scan designed circuit. Furthermore, we identify some new classes of sequential circuits that contain some cyclic sequential circuits, which are τ-equivalent and τ^2-bounded. These classes are the l-length-bounded testable circuits, l-length-bounded validity-identifiable circuits, t-time-bounded testable circuits and t-time-bounded validity-identifiable circuits. In addition, we provide two examples of circuits belonging to these classes, namely countercycle finite state machine realizations and state-shiftable finite state machine realizations. Instead of using a DFT method, a given sequential circuit described at the finite state machine (FSM) level can be synthesized using another test methodology called synthesis for testability (SFT) into a circuit that belongs to one of the easily testable classes of cyclic sequential circuits.

• 2005-12-01

著者

• Fujiwara Hideo

  Graduate School Of Information Science Nara Institute Of Science And Technology

• Ooi Chia

  Universiti Teknologi Malaysia

• Ooi Chia

  Graduate School Of Information Science Nara Institute Of Science And Technology Kansai Science City

• Fujiwara Hideo

  Computer Design And Test Lab Nara Institute Of Science And Technology

• Fujiwara Hideo

  Nara Institute Of Science And Technology

• CLOUQUEUR Thomas

  AMD Corporation

• CLOUQUEUR Thomas

  Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)

• Fujiwara Hideo

  Graduate School Of Information Of Science Nara Institute Of Science And Technology

• Fujiwara Hideo

  Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn

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