Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths(Dependable Computing)

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概要

• 論文の詳細を見る

• This paper proposes two power-constrained test synthesis schemes and scheduling algorithms, under non-scan BIST, for RTL data paths. The first scheme uses boundary non-scan BIST, and can achieve low hardware overheads. The second scheme uses generic non-scan BIST, and can offer some tradeoffs between hardware overhead, test application time and power dissipation. A designer can easily select an appropriate design parameter based on the desired tradeoff. Experimental results confirm the good performance and practicality of our new approaches.

• 社団法人電子情報通信学会の論文
• 2005-08-01

著者

• Fujiwara Hideo

  Graduate School Of Information Science Nara Institute Of Science And Technology

• Inoue Michiko

  Nara Institute Of Science And Technology:japan Science And Technology Agency Crest

• Inoue Michiko

  Graduate School Of Information Science Nara Institute Of Science And Technology (naist)

• Fujiwara Hideo

  Computer Design And Test Lab Nara Institute Of Science And Technology

• Inoue Michiko

  Graduate School Of Information Science Nara Institute Of Science And Technology

• Yamaguchi Ken'ichi

  Nara National College Of Technology

• Fujiwara Hideo

  Graduate School Of Information Of Science Nara Institute Of Science And Technology

• Savir Jacob

  New Jersey Institute Of Technology (njit)

• Fujiwara Hideo

  Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn

• You Zhiqiang

  Software School Hunan University

• YOU Zhiqiang

  Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)

関連論文

• Classification of Sequential Circuits Based on τ^k Notation and Its Applications(VLSI Systems)
• F-Scan: A DFT Method for Functional Scan at RTL
• Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• On the Effect of Scheduling in Test Generation
• Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on τ^k-Notation(Complexity Theory)
• D-10-18 An Approach to Temperature Control During VLSI Test
• Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors
• Reduction in Over-Testing of Delay Faults through False Paths Identification Using RTL Information
• Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability(Dependable Computing)
• Non-scan Design for Single-Port-Change Delay Fault Testability (特集:システムLSI設計とその技術)
• A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint(Test)(Dependable Computing)
• A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint
• Design for Two-Pattern Testability of Controller-Data Path Circuits
• Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• Analyzing Path Delay Fault Testability of RTL Data Paths: A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency
• NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints
• On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time
• Scheduling Power-Constrained Tests through the SoC Functional Bus
• NoC Wrapper Optimization under Channel Bandwidth and Test Time Constraints
• Power-Conscious Microprocessor-Based Testing of System-on-Chip
• Power-Conscious Microprocessor-Based Testing of System-on-Chip(テスト,システム設計及び一般)
• Program-Based Delay Fault Self-Testing of Processor Cores
• Program-Based Delay Fault Self-Testing of Processor Cores (デザインガイア2003--VLSI設計の新しい大地を考える研究会)
• Program-Based Delay Fault Self-Testing of Processor Cores (デザインガイア2003--VLSI設計の新しい大地を考える研究会)
• Program-Based Delay Fault Self-Testing of Processor Cores (デザインガイア2003--VLSI設計の新しい大地を考える研究会)
• Program-Based Delay Fault Self-Testing of Processor Cores
• A Test Generation Framework using Checker Circuits and its Application to Path Delay Test Generation
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
• Equivalence of Sequential Transition Test Generation and Constrained Combinational Stuck-at Test Generation
• A Design Scheme for Delay Testing of Controllers Using State Transition Information
• A Simple Parallel Algorithm for the Medial Axis Transform (Special Issue on Architectures Algorithms and Networks for Massively parallel Computing)
• FOREWORD
• Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips
• Effective Domain Partitioning for Multi-Clock Domain IP Core Wrapper Design under Power Constraints
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (システムLSI設計技術・デザインガイア2007--VLSI設計の新しい大地を考える研究会)
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (ディペンダブルコンピューティング)
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (VLSI設計技術)
• Power constrained IP core wrapper design with partitioned clock domains (回路とシステム)
• Power constrained IP core wrapper design with partitioned clock domains (VLSI設計技術)
• Power constrained IP core wrapper design with partitioned clock domains (信号処理)
• Performance Analysis of Parallel Test Generation for Combinational Circuits
• A New Class of Sequential Circuits with Combinational Test Generation Complexity for Path Delay Faults
• Preemptive System-on-Chip Test Scheduling(SoC Testing)(Test and Verification of VLSI)
• Design for Hierarchical Two-Pattern Testability of Data Paths
• A Self-Stabilizing Spanning Tree Protocol that Tolerates Non-quiescent Permanent Faults
• A DFT Method for Core-Based Systems-on-a-Chip Based on Consecutive Testability
• Effect of BIST Pretest on IC Defect Level(Dependable Computing)
• Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST(Dependable Computing)
• A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
• Classification of Sequential Circuits Based on Combinational Test Generation Complexity
• A Non-scan DFT Method at Register-Transfer Level to Achieve 100% Fault Efficiency (特集:システムLSIの設計技術と設計自動化)
• Parallel Selection Algorithms for CGM and BSP Models with Application to Sorting (特集 並列処理) -- (並列・分散アルゴリズム)
• Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths(Dependable Computing)
• F-Scan : A DFT Method for Functional Scan at RTL
• A Low Power Deterministic Test Using Scan Chain Disable Technique
• A secure scan design approach using extended de Bruijn graph (ディペンダブルコンピューティング)
• A New Data Structure for SAT-Based Static Learning With Impact on Test Generation (特集 新アーキテクチャLSI技術および一般)
• Non-scan Design for Testability for Synchronous Sequential Circuits Based on Fault-Oriented Conflict Analysis(Fault Tolerance)
• Non-scan Design for Testability for Synchronous Sequential Circuits Based on Fault-Oriented Conflict Analysis
• A Method of Path Mapping from RTL to Gate Level and Its Application to False Path Identification
• Differential Behavior Equivalent Classes of Shift Register Equivalents for Secure and Testable Scan Design

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