Differential Behavior Equivalent Classes of Shift Register Equivalents for Secure and Testable Scan Design
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概要
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It is important to find an efficient design-for-testability methodology that satisfies both security and testability, although there exists an inherent contradiction between security and testability for digital circuits. In our previous work, we reported a secure and testable scan design approach by using extended shift registers that are functionally equivalent but not structurally equivalent to shift registers, and showed a security level by clarifying the cardinality of those classes of shift register equivalents (SR-equivalents). However, SR-equivalents are not always secure for scan-based side-channel attacks. In this paper, we consider a scan-based differential-behavior attack and propose several classes of SR-equivalent scan circuits using dummy flip-flops in order to protect the scan-based differential-behavior attack. To show the security level of those SR-equivalent scan circuits, we introduce a differential-behavior equivalent relation and clarify the number of SR-equivalent scan circuits, the number of differential-behavior equivalent classes and the cardinality of those equivalent classes.
- 2011-07-01
著者
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Fujiwara Hideo
Graduate School Of Information Of Science Nara Institute Of Science And Technology
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Tamamoto Hideo
Graduate School Of Engineering And Resource Sci. Akita Univ.
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Tamamoto Hideo
Graduate School Of Engineering And Resource Science Akita University
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FUJIWARA Katsuya
Graduate School of Engineering and Resource Science, Akita University
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