Photoluminescence of Homoepitaxial 3C-SiC on Sublimation-Grown 3C-SiC Substrates
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-09-01
著者
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KIMOTO Tsunenobu
Department of Electronic Science and Engineering, Kyoto University
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Matsunami H
Kyoto Univ. Kyoto Jpn
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MATSUNAMI Hiroyuki
Department of Electronic Science & Engineering, Kyoto University
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Kimoto T
Kyoto Univ. Kyoto Jpn
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NISHINO Katsushi
Department of Electrical and Electronic Engineering, University of Tokushima
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Nishino K
Department Of Electrical And Electronic Engineering The University Of Tokushima
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Nishino K
Department Of Electronic Science And Engineering Kyoto University
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Nishino Katsushi
Department Of Electrical And Electronic Engineering The University Of Tokushima
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Kimoto Tsunenobu
Department Of Electrical Engineering Faculty Of Engineering Kyoto University
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Matsunami Hiroyuki
Department Of Electrical Engineering Kyoto University
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Matsunami Hiroyuki
Department Of Eectrical Engineering Kyoto University
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Matsunami Hiroyuki
Department of Electronic Science and Engineering, Kyoto University
関連論文
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- Stability of deep centers in 4H-SiC epitaxial layers during thermal annealing
- 4H-polytype AlN grown on 4H-SiC(11(2)over-bar0) substrate by polytype replication
- Hetero-Interface Properties of SiO_2/4H-SiC on Various Crystal Orientations(Heterostructure Microelectronics with TWHM2003)
- Fabrication of SiC lateral super junction diodes with multiple stacking p- and n-layers
- Interface properties in metal-oxide-semiconductor structures on n-type 4H-SiC(03(3)over-bar8)
- Avalanche phenomena in 4H-SiC p-n diodes fabricated by aluminum or boron implantation
- Shallow states at SiO2/4H-SiC interface on (11(2)over-bar-0) and (0001) faces
- Anisotropy in breakdown field of 4H-SiC
- High-energy (MeV) Al and B ion implantations into 4H-SiC and fabrication of pin diodes
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- Low-loss, high-voltage 6H-SiC epitaxial p-i-n diode
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- Recent Progress in SiC Ion Implantation and MOS Technologies for High Power Devices
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- Time-Resolved Reflection High-Energy Electron Diffraction Analysis in Initial Stage of 3C-SiC Growth on Si(001) by Gas Source Molecular Beam Epitaxy
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