Reduction of Double Positioning Twinning in 3C-SiC Grown on α-SiC Substrates
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1997-08-15
著者
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KIMOTO Tsunenobu
Department of Electronic Science and Engineering, Kyoto University
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Matsunami H
Kyoto Univ. Kyoto Jpn
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MATSUNAMI Hiroyuki
Department of Electronic Science & Engineering, Kyoto University
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NISHINO Katsushi
Department of Electrical and Electronic Engineering, University of Tokushima
関連論文
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- Electrical activation of high-concentration aluminum implanted in 4H-SiC
- Stability of deep centers in 4H-SiC epitaxial layers during thermal annealing
- 4H-polytype AlN grown on 4H-SiC(11(2)over-bar0) substrate by polytype replication
- Hetero-Interface Properties of SiO_2/4H-SiC on Various Crystal Orientations(Heterostructure Microelectronics with TWHM2003)
- Fabrication of SiC lateral super junction diodes with multiple stacking p- and n-layers
- Interface properties in metal-oxide-semiconductor structures on n-type 4H-SiC(03(3)over-bar8)
- Avalanche phenomena in 4H-SiC p-n diodes fabricated by aluminum or boron implantation
- Shallow states at SiO2/4H-SiC interface on (11(2)over-bar-0) and (0001) faces
- Anisotropy in breakdown field of 4H-SiC
- High-energy (MeV) Al and B ion implantations into 4H-SiC and fabrication of pin diodes
- Remarkable lattice recovery and low sheet resistance of phosphorus-implanted 4H-SiC (11(2)over-bar0)
- Molecular-beam epitaxial growth of insulating AlN on surface-controlled 6H-SiC substrate by HCl gas etching
- Low-loss, high-voltage 6H-SiC epitaxial p-i-n diode
- Reduction of doping and trap concentrations in 4H-SiC epitaxial layers grown by chemical vapor deposition
- Recent Progress in SiC Ion Implantation and MOS Technologies for High Power Devices
- Formation of periodic steps with a unit-cell height on 6H-SiC (0001) surface by HCl etching
- High Channel Mobility in Inversion Layer of SiC MOSFETs for Power Switching Transistors
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- Performance limiting surface defects in SiC epitaxial p-n junction diodes
- Cracking of Saturated Hydrocarbon Gas Molecular Beam for Carbonization of Si(001) Surface
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- Scanning Capacitance and Spreading Resistance Microscopy of SiC Multiple-pn-Junction Structure : Semiconductors
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