Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1999-11-15

著者

• Okamoto Kazuya

  Central Research Laboratory Nikon Corporation

• Takeguchi Masaki

  High Voltage Electron Microscopy Station National Institute For Materials Science

• Suzuki Takayuki

  Physics Department,Tokyo Institute of Technology

• Yagi Katsumichi

  Physics Department,Tokyo Institute of Technology

• Miura Hidetoshi

  Physics Department Tokyo Institute Of Technology

• TANISHIRO Yasumasa

  Physics Department, Tokyo Institute of Technology

• OKAMOTO Kimiharu

  JEOL Limited

• ISHIGURO Nami

  Physics Department, Tokyo Institute of Technology

• MIMODA Hiroki

  Physics Department, Tokyo Institute of Technology

• TAKEGUCHI Masaki

  Refined Beam Research Unit, NRIM

• TAKEGUCHI Masaki

  Advanced Nano-characterization Center, National Institute for Materials Science

• Ishiguro Nami

  Physics Department Tokyo Institute Of Technology

• Tanishiro Y

  Physics Department Tokyo Institute Of Technology

• Takeguchi M

  National Institute For Materials Science

• Okamoto K

  Jeol Limited

• Yagi K

  Physics Department Tokyo Institute Of Technology Oh-okayama

• Minoda Hiroki

  Physics Department Tokyo Institute Of Technology

• Tanishiro Yasumasa

  Physics Department Tokyo Institute Of Technology

• Yagi Katsumichi

  Physics Department Tokyo Institute Of Technology

• Tanaka Miyoko

  High Voltage Electron Microscopy Station National Institute For Materials Science

• Takeguchi Masaki

  Department Of Applied Physics Faculty Of Engineering Osaka University

• Suzuki Takayuki

  Physics Department Tokyo Institute Of Technology

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