TANISHIRO Yasumasa | Physics Department, Tokyo Institute of Technology
スポンサーリンク
概要
関連著者
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TANISHIRO Yasumasa
Physics Department, Tokyo Institute of Technology
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Tanishiro Y
Physics Department Tokyo Institute Of Technology
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Tanishiro Yasumasa
Physics Department Tokyo Institute Of Technology
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Yagi Katsumichi
Physics Department,Tokyo Institute of Technology
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Yagi Katsumichi
Physics Department Tokyo Institute Of Technology
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Yagi K
Physics Department Tokyo Institute Of Technology Oh-okayama
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Minoda Hiroki
Physics Department Tokyo Institute Of Technology
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Minoda Hiroki
Physics Department,Tokyo Institute of Technology
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Suzuki Takayuki
Physics Department,Tokyo Institute of Technology
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TAKAYANAGI Kunio
Physics Department, Tokyo Institute of Technology
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Takayanagi Kunio
Physics Department Tokyo Institute Of Technology
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Yamanaka Akira
Physics Department Tokyo Institute Of Technology
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ISHIGURO Nami
Physics Department, Tokyo Institute of Technology
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Degawa Masashi
Physics Department Tokyo Institute Of Technology Oh-okayama:(present) Department Of Physics Universi
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Ishiguro Nami
Physics Department Tokyo Institute Of Technology
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Ozawa Sho-ichiro
Physics Department Tokyo Institute Of Technology
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Suzuki Takayuki
Physics Department Tokyo Institute Of Technology
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YAMANAKA Akira
Physics Department, Tokyo Institute of Technology
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佐藤 文隆
甲南大
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Okamoto Kazuya
Central Research Laboratory Nikon Corporation
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Takeguchi Masaki
High Voltage Electron Microscopy Station National Institute For Materials Science
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NAKAYAMA Tsuneyosi
Department of Applied Physics, Hokkaido University
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Takayanagi Kunio
Department Of Materials Science And Engeneering Interdisciplinary Graduate School Of Science And Eng
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Nakayama Tsuneyosi
Department Of Applied Physics Hokkaido University
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Miura Hidetoshi
Physics Department Tokyo Institute Of Technology
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OKAMOTO Kimiharu
JEOL Limited
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MIMODA Hiroki
Physics Department, Tokyo Institute of Technology
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TAKEGUCHI Masaki
Refined Beam Research Unit, NRIM
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TAKEGUCHI Masaki
Advanced Nano-characterization Center, National Institute for Materials Science
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YAGI Katumichi
Physics Department, Tokyo Institute of Technology, Oh-okayama
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NISHIMURA Hozumi
Physics Department, Tokyo Institute of Technology
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LATYSHEV Alexander
Physics Department, Tokyo Institute of Technology
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SATO Hiroaki
Physics Department, Tokyo Institute of Technology
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SHIMA Masashi
Physics Department, Tokyo Institute of Technology
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OHSE Hironori
Physics Department, Tokyo Institute of Technology
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OZAWA Sho-Ichiro
Physics Department, Tokyo Institute of Technology
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OZAWA Soh-ichiro
Physics Department, Tokyo Institute of Technology
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KOBAYASHI Kunio
Physics Department, Tokyo Institute of Technology
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K0BAYASHI Kunio
Physics Department, Tokyo Institute of Technology
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AKIYAMA Kazuhiro
Physics Department, Tokyo Institute of Technology
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NAKAYAMA Tomonobu
Physics Department, Tokyo Institute of Technology
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K0bayashi Kunio
Physics Department Tokyo Institute Of Technology
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Takeguchi M
National Institute For Materials Science
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Akiyama Kazuhiro
Physics Department Tokyo Institute Of Technology
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Okamoto K
Jeol Limited
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Ohse Hironori
Physics Department Tokyo Institute Of Technology
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Shima Masashi
Physics Department Tokyo Institute Of Technology
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Nishimura Hozumi
Physics Department Tokyo Institute Of Technology
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Tanaka Miyoko
High Voltage Electron Microscopy Station National Institute For Materials Science
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Takeguchi Masaki
Department Of Applied Physics Faculty Of Engineering Osaka University
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Kobayashi Kunio
Physics Department Tokyo Institute Of Technology
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Latyshev Alexander
Physics Department Tokyo Institute Of Technology:institute Of Semiconductor Physics Russian Academy
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Sato Hiroaki
Physics Department Tokyo Institute Of Technology
著作論文
- Surface Structures Observed by High-Resolution UHV Electron Microscopy at Atomic Level
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- New Phase Diagram of Step Instabilities on Si(111) Vicinal Surfaces Induced by DC Annealing : Condensed Matter: Structure, etc.
- Energy-filtered Electron Interferometry in Reflection Electron Microscopy
- Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces
- Ultra High Vacuum Reflection Electron Microscopy Study of Step-Dislocation Interaction on Si(111) Surface
- UHV-TEM-REM Studies of Si(111) Surfaces
- A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces
- Biatomic Layer-High Steps on Si(001)2×1 Surface