Tanaka Miyoko | High Voltage Electron Microscopy Station National Institute For Materials Science
スポンサーリンク
概要
関連著者
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Takeguchi Masaki
High Voltage Electron Microscopy Station National Institute For Materials Science
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Tanaka Miyoko
High Voltage Electron Microscopy Station National Institute For Materials Science
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Takeguchi M
National Institute For Materials Science
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Takeguchi Masaki
Department Of Applied Physics Faculty Of Engineering Osaka University
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TAKEGUCHI Masaki
Advanced Nano-characterization Center, National Institute for Materials Science
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Furuya Kazuo
High Voltage Electron Microscopy Station National Institute For Materials Science
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Furuya Kazuo
National Institute For Materials Science
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Furuya K
National Institute For Materials Science
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SHIMOJO Masayuki
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Mitsuishi K
National Institute For Materials Science
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MITSUISHI Kazutaka
High Voltage Electron Microscopy Station, National Institute for Materials Science
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FURUYA Kazuo
National Research Institute for Metals
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TAKEGUCHI Masaki
National Institute for Materials Science
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Takeguchi Masaki
National Institute for Material Science, 3-13 Sakura, Tsukuba 305-0003, Japan
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安田 秀幸
大阪大学大学院工学研究科
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TAKEGUCHI Masaki
High Voltage Electron Microscopy Station, National Institute for Materials Science
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MITSUISHI Kazutaka
National Institute for Materials Science
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TANAKA Miyoko
High Voltage Electron Microscopy Station, National Institute for Materials Science
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志水 隆一
大阪工業大学
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Okamoto Kazuya
Central Research Laboratory Nikon Corporation
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SONG Minghui
Okayama University of Science
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志水 隆一
Osaka Inst. Technol. Osaka Jpn
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志水 隆一
大阪工業大学情報科学部情報科学科
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Song Minghui
Advanced Nano Characterization Center National Institute For Materials Science
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Zhang Wei
High Voltage Electron Microscopy Station National Institute For Materials Science
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Song Minghui
High Voltage Electron Microscopy Station National Institute For Materials Science
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OKAMOTO Kimiharu
JEOL Limited
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TAKEGUCHI Masaki
Refined Beam Research Unit, NRIM
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CHE Renchao
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Che Renchao
High Voltage Electron Microscopy Station National Institute For Materials Science
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YASUDA Hidehiro
National Institute for Materials Science
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Tanishiro Y
Physics Department Tokyo Institute Of Technology
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CHU Fengmin
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Okamoto K
Jeol Limited
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Yagi K
Physics Department Tokyo Institute Of Technology Oh-okayama
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Chu Fengmin
High Voltage Electron Microscopy Station National Institute For Materials Science
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Minoda Hiroki
Physics Department Tokyo Institute Of Technology
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Suzuki Takayuki
Physics Department Tokyo Institute Of Technology
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SUZUKI Takayuki
Department of Neurosurgery, Himeji Medical Center
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HASHIMOTO Ayako
Kanagawa Academy of Science and Technology
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KAJIKAWA Kotaro
Interdisciplinary Graduate School of Science and Technology, Tokyo Institute of Technology
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Suzuki Takayuki
Physics Department,Tokyo Institute of Technology
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Yagi Katsumichi
Physics Department,Tokyo Institute of Technology
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Miura Hidetoshi
Physics Department Tokyo Institute Of Technology
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Guo Xing
National Institute For Materials Science
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Rao Jiancun
High Voltage Electron Microscopy Station National Institute For Materials Science
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Akita Tomoki
Department Of Applied Physics Faculty Of Engineering Osaka University
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Minoda Hiroki
Department Of Applied Physics Tokyo University Of Agriculture And Technology:crest Japan Science And
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TANISHIRO Yasumasa
Physics Department, Tokyo Institute of Technology
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ISHIGURO Nami
Physics Department, Tokyo Institute of Technology
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MIMODA Hiroki
Physics Department, Tokyo Institute of Technology
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Tanaka Miyoko
National Institute For Materials Science
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HASHIMOTO Ayako
Advanced Nano-characterization Center, National Institute for Materials Science
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Shimizu Ryuichi
Department Of Applied Physics Faculty Of Engineering Osaka University
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Ishiguro Nami
Physics Department Tokyo Institute Of Technology
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Tanishiro Yasumasa
Department Of Physics Tokyo Institute Of Technology
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YAGI Katsumichi
Department of Physics, Tokyo Institute of Technology
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Kajikawa Kotaro
Interdisciplinary Graduate School Of Science And Engineering Tokyo Institute Of Technology
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OKUNO Hanako
National Institute for Materials Science
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HAN Ming
High Voltage Electron Microscopy Station, National Institute for Materials Science
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LIU Junliang
National Research Institute for Metals
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Han M
Univ. Seoul Seoul Kor
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Furuya Kazuo
Advanced Nano Characterization Center National Institute For Materials Science
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WU Yuan
National Research Institute for Metals
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Tanishiro Yasumasa
Physics Department Tokyo Institute Of Technology
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Takeguchi Masaki
Advanced Nano-characterization Center National Institute For Materials Science
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Yagi Katsumichi
Physics Department Tokyo Institute Of Technology
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Yagi Katsumichi
Department Of Physics Tokyo Institute Of Technology
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TAKEGUCHI Masaki
Department of Applied Physics, Faculty of Engineering, Osaka University
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Suzuki Takayuki
Department Of Neurosurgery Himeji Medical Center
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Suzuki Takayuki
Department Of Biochemistry Nippon Roche Research Center
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Suzuki Takayuki
Department Of Applied Chemistry Faculty Of Engineering Gifu University
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Shimizu Ryuichi
Department Of Applied Physics Faculty Engineering Osaka University
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Rao Jjancun
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Zhang Wei
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Japan
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Tanaka Miyoko
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Japan
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Furuya Kazuo
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba, Ibaraki 305-0003, Japan
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Furuya Kazuo
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Japan
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Mitsuishi Kazutaka
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Japan
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Shimojo Masayuki
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba, Ibaraki 305-0003, Japan
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Tanishiro Yasumasa
Department of Material Science and Engineering, Tokyo Institute of Technology, Meguro, Tokyo 152-8551, Japan
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Takeguchi Masaki
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Japan
著作論文
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- Effects of Heat Treatment on Electric Properties of Nanorods Formed by Electron Beam-Induced Deposition
- Development of a stage-scanning system for high-resolution confocal STEM
- Design features of a new ultra-high vacuum electron microscope with an omega filter
- Study of Defects and Strains on Cleaved GaAs (110) Surface by Reflection Electron Microscopy
- Observation of GaAs(110)Surface Defect by Reflection Electron Holography
- Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis
- Relationship between X-ray Intensity and Electric Bias on Al_2O_3 Surface during Low Energy Ga^+ Irradiation
- Morphology of Iron Silicide Nanorods Formed by Electron-Beam-Induced Deposition Using Ultrahigh-Vacuum Transmission Electron Microscope
- Amorphous-like nanostructures stabilized in nanometre-sized alloy clusters (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- Structural observation of Pd silicide islands on Si(111) surfaces with UHV-TEM/STM (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface
- New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS waves
- Gold Seed Arrangement on Nanoporous Anodic Aluminum Oxide Membrane by Centrifugal Force
- High Resolution Transmission Electron Microscopy Study on the Structure of Ge Nanoparticles by Using an Ultrahigh Vacuum-Molecular Beam Epitaxy-Transmission Electron Microscope System
- Observation of Reconstructed Pt(100) Surface by Reflection Electron Microscopy
- HRTEM observation of BN films segregated on stainless steel SUS304 by low temperature heat treatment (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- Mechanisms of Crystalline Iron Oxide Formation in Electron Beam-Induced Deposition
- Nanodot and Nanorod Formation in Electron-Beam-Induced Deposition Using Iron Carbonyl