Mitsuishi K | National Institute For Materials Science
スポンサーリンク
概要
関連著者
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Mitsuishi K
National Institute For Materials Science
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Furuya Kazuo
National Institute For Materials Science
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Furuya Kazuo
High Voltage Electron Microscopy Station National Institute For Materials Science
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Furuya K
National Institute For Materials Science
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SONG Minghui
Okayama University of Science
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Song Minghui
Advanced Nano Characterization Center National Institute For Materials Science
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Song Minghui
High Voltage Electron Microscopy Station National Institute For Materials Science
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Furuya Kazuo
Advanced Nano Characterization Center National Institute For Materials Science
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Takeguchi Masaki
High Voltage Electron Microscopy Station National Institute For Materials Science
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Takeguchi M
National Institute For Materials Science
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Takeguchi Masaki
Department Of Applied Physics Faculty Of Engineering Osaka University
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FURUYA Kazuo
National Research Institute for Metals
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MITSUISHI Kazutaka
National Institute for Materials Science
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Tanaka Miyoko
High Voltage Electron Microscopy Station National Institute For Materials Science
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MITSUISHI Kazutaka
High Voltage Electron Microscopy Station, National Institute for Materials Science
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TAKEGUCHI Masaki
Advanced Nano-characterization Center, National Institute for Materials Science
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Xie Guoqiang
Graduate School Of Science And Technology Niigata University
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SHIMOJO Masayuki
High Voltage Electron Microscopy Station, National Institute for Materials Science
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SONG Minghui
National Institute for Materials Science
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TAKEGUCHI Masaki
National Institute for Materials Science
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Takeguchi Masaki
National Institute for Material Science, 3-13 Sakura, Tsukuba 305-0003, Japan
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安田 秀幸
大阪大学大学院工学研究科
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TAKEGUCHI Masaki
High Voltage Electron Microscopy Station, National Institute for Materials Science
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HASHIMOTO Ayako
Kanagawa Academy of Science and Technology
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TANAKA Miyoko
High Voltage Electron Microscopy Station, National Institute for Materials Science
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OHASHI Osamu
Graduate School of Science and Technology, Niigata University
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SONG Minghui
Nanomaterials Laboratory, National Institute for Materials Science
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FURUYA Kazuo
Nanomaterials Laboratory, National Institute for Materials Science
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MITSUISHI Kazutaka
Nanomaterials Laboratory, National Institute for Materials Science (NIMS)
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YASUDA Hidehiro
National Institute for Materials Science
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Ohashi Osamu
Graduate School Of Science And Technology Niigata University
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Sato Takahiro
Graduate School of Science and Technology, Kumamoto University
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Nozawa Takashi
Institute Of Advanced Energy Kyoto University
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Birtcher Robert
Argonne National Laboratory
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SAITO Tetsuya
National Research Institute for Metals
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HASHIMOTO Hatsujiro
Department of Physics, Kyoto Technical University
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NODA Tetsuji
National Institute for Materials Science
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Yamaguchi N
Graduate School Of Science And Technology Niigata University
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Zhang Wei
High Voltage Electron Microscopy Station National Institute For Materials Science
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Guo Xing
National Institute For Materials Science
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Noda T
National Institute For Materials Science
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Yamaguchi Norio
Graduate School Of Science And Technology Niigata University
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CHE Renchao
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Che Renchao
High Voltage Electron Microscopy Station National Institute For Materials Science
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Tanaka Miyoko
National Institute For Materials Science
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MITSUISHI Kazutaka
Advanced Nano Characterization Center, National Institute for Materials Science
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FURUYA Kazuo
Advanced Nano Characterization Center, National Institute for Materials Science
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XIE Guoqiang
High Voltage Electron Microscopy Station, National Institute for Materials Science
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LIU Zhi-Quan
Nanomaterials Laboratory, National Institute for Materials Science (NIMS)
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YOSHIOKA Takayuki
Graduate School of Science and Technology, Niigata University
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ALLEN Charles
Argonne National Laboratory
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DAHMEN Ulrich
Lawrence Berkeley National Laboratory
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HASHIMOTO Ayako
Advanced Nano-characterization Center, National Institute for Materials Science
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OKUNO Hanako
National Institute for Materials Science
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SHIMOJO Masayuki
Advanced Science Research Laboratory, Saitama Institute of Technology
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HAN Ming
High Voltage Electron Microscopy Station, National Institute for Materials Science
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CHU Fengmin
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Chu Fengmin
High Voltage Electron Microscopy Station National Institute For Materials Science
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Han M
Univ. Seoul Seoul Kor
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Hashimoto Hatsujiro
Department Of Applied Physics Faculty Of Engineering Osaka University
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Takeguchi Masaki
Advanced Nano-characterization Center National Institute For Materials Science
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Sato Takahiro
Graduate School Of Agricultural Science Tohoku University
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Sato T
Niigata Univ. Niigata Jpn
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Saito Tetsuya
National Institute For Materials Science
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Yoshioka Takayuki
Graduate School Of Science And Technology Niigata University
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Noda Tetsuji
National Inst. For Materials Sci. Tsukuba Jpn
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Sato Takahiro
Graduate School Of Science And Technology Niigata University
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Hashimoto Hatsujiro
Department Of Mechanical Engineering Okayama University Of Science
著作論文
- Effects of Heat Treatment on Electric Properties of Nanorods Formed by Electron Beam-Induced Deposition
- Fabrication of Free-Standing Tungsten-Nanowhiskers on SiO_2 Substrates with Electron-Beam Induced Deposition
- Fabrication and Characterization of Self-Standing W-Nanodendrites on Insulator SiO_2 Substrate by Electron-Beam-Induced Deposition under HVTEM
- Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filtering
- Effect of Mg on the Sintering of Al-Mg Alloy Powders by Pulse Electric-Current Sintering Process
- Dynamic process of nano-structured inert gas precipitates introduced with ion implantation in aluminium (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- Effect of Interface Behavior between Particles on Properties of Pure Al Powder Compacts by Spark Plasma Sintering
- In-situ, analytical, high-voltage and high-resolution transmission electron microscopy of Xe ion implantation into Al
- Xe precipitates at grain boundaries in Al under 1 MeV electron irradiation
- Three-dimensional imaging of carbon nanostructures by scanning confocal electron microscopy
- Development of a stage-scanning system for high-resolution confocal STEM
- Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis
- Proximity Effect in Electron-Beam-Induced Deposition
- Morphology of Iron Silicide Nanorods Formed by Electron-Beam-Induced Deposition Using Ultrahigh-Vacuum Transmission Electron Microscope
- Amorphous-like nanostructures stabilized in nanometre-sized alloy clusters (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS waves
- Fabrication and investigation of tungsten deposit on top and bottom surfaces of thin film substrate (Special issue: Microprocesses & nanotechnology)
- Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images