Development of a stage-scanning system for high-resolution confocal STEM
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概要
- 論文の詳細を見る
- 2008-08-01
著者
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Takeguchi Masaki
High Voltage Electron Microscopy Station National Institute For Materials Science
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HASHIMOTO Ayako
Kanagawa Academy of Science and Technology
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Furuya Kazuo
National Institute For Materials Science
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Furuya Kazuo
High Voltage Electron Microscopy Station National Institute For Materials Science
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SHIMOJO Masayuki
High Voltage Electron Microscopy Station, National Institute for Materials Science
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MITSUISHI Kazutaka
High Voltage Electron Microscopy Station, National Institute for Materials Science
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TAKEGUCHI Masaki
Advanced Nano-characterization Center, National Institute for Materials Science
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HASHIMOTO Ayako
Advanced Nano-characterization Center, National Institute for Materials Science
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Takeguchi M
National Institute For Materials Science
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Furuya K
National Institute For Materials Science
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Takeguchi Masaki
Advanced Nano-characterization Center National Institute For Materials Science
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Tanaka Miyoko
High Voltage Electron Microscopy Station National Institute For Materials Science
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Takeguchi Masaki
Department Of Applied Physics Faculty Of Engineering Osaka University
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Mitsuishi K
National Institute For Materials Science
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