Relationship between X-ray Intensity and Electric Bias on Al_2O_3 Surface during Low Energy Ga^+ Irradiation
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2006-03-20
著者
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TAKEGUCHI Masaki
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Takeguchi Masaki
High Voltage Electron Microscopy Station National Institute For Materials Science
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SONG Minghui
Okayama University of Science
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Song Minghui
Advanced Nano Characterization Center National Institute For Materials Science
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Rao Jiancun
High Voltage Electron Microscopy Station National Institute For Materials Science
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Furuya Kazuo
National Institute For Materials Science
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Furuya Kazuo
High Voltage Electron Microscopy Station National Institute For Materials Science
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Song Minghui
High Voltage Electron Microscopy Station National Institute For Materials Science
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CHE Renchao
High Voltage Electron Microscopy Station, National Institute for Materials Science
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Che Renchao
High Voltage Electron Microscopy Station National Institute For Materials Science
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TAKEGUCHI Masaki
Advanced Nano-characterization Center, National Institute for Materials Science
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Takeguchi M
National Institute For Materials Science
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Furuya K
National Institute For Materials Science
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Tanaka Miyoko
High Voltage Electron Microscopy Station National Institute For Materials Science
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Takeguchi Masaki
Department Of Applied Physics Faculty Of Engineering Osaka University
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Rao Jjancun
High Voltage Electron Microscopy Station, National Institute for Materials Science
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