Study of Defects and Strains on Cleaved GaAs (110) Surface by Reflection Electron Microscopy
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概要
著者
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志水 隆一
大阪工業大学
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Takeguchi Masaki
High Voltage Electron Microscopy Station National Institute For Materials Science
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志水 隆一
Osaka Inst. Technol. Osaka Jpn
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志水 隆一
大阪工業大学情報科学部情報科学科
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TAKEGUCHI Masaki
Advanced Nano-characterization Center, National Institute for Materials Science
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Takeguchi M
National Institute For Materials Science
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Tanaka Miyoko
High Voltage Electron Microscopy Station National Institute For Materials Science
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Takeguchi Masaki
Department Of Applied Physics Faculty Of Engineering Osaka University
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