ダイヤモンドをよく知るために--評価法(16)透過型電子顕微鏡(1)概論
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概要
著者
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志水 隆一
大工大
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志水 隆一
大阪工業大学
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Takai Yoshiaki
Nagoya University
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志水 隆一
Osaka Inst. Technol. Osaka Jpn
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志水 隆一
大阪工業大学情報科学部情報科学科
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多留谷 政良
大阪大学大学院工学研究科応用物理学専攻
関連論文
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- Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-Rays by Electron Impact (Short Note)
- Fourier analysis of HRTEM image deterioration caused by mechanical vibration
- Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum
- Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
- Flattening of Surface by Sputter-Etching with Low-Energy Ions : Instrumentation, Measurement, and Fabrication Technology
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- Photoconduction in Polyvinyl Carbazole Thin Films Polymerized by Plasma-CVD
- Evidence of Mobile Ag and Growth Mechanism of YBa_2Cu_3O_7-y Films Deposited on Cube Textured Ag Tape by Chemical Vapor Deposition
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- Temperature Dependence of Photocurrent in Polyethylene
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- Bismuth Valence Studies of As-Grown Superconducting Bi-Sr-Ca-Cu-O Thin Films with T_ from 98 K to 66 K
- High-T_c (95 K) As-Grown Superconducting Bi-Sr-Ca-Cu-O Thin Films
- Superconducting Properties of Y-Ba-Cu-O Thin Films Prepared by RF Magnetron Sputtering with a Grid Electrode
- Influence of Native Oxides on the Reliability of Ultrathin Gate Oxide
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- Deposition of Y-Ba-Cu-O Thin Films by RF Magnetron Sputtering with a Grid Electrode: Plasma Parameters
- Fabrication Process and Properties of Nb-InSb-Nb Planar Junction
- Submicrometer-Scale Patterning of Superconducting Nb Films Using Focused Ion Beam
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