Fourier analysis of HRTEM image deterioration caused by mechanical vibration

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 2001-10-01

著者

• 高井 義造

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• Takai Yoshiaki

  Depertment Of Electrical Engineering Nagoya University

• Takai Yoshiaki

  Nagoya University

• SHIMIZU Ryuichi

  Department of Applied Physics, Osaka University

• 木村 吉秀

  阪大院・工

• KIMURA Yoshihide

  Department of Applied Physics, Osaka University

• KAWASAKI Tadahiro

  Department of Material and Life Sciences, Graduate School of Engineering, Osaka University

• TAKAI Yoshizo

  Department of Material and Life Sciences, Graduate School of Engineering, Osaka University

• 木村 吉秀

  大阪大 大学院工学研究科

• Souda R

  National Institute For Research In Inorganic Materials

• Takai Yoshizo

  Department Of Applied Physics Faculty Of Engineering Osaka University

• Shimizu R

  Department Of Information Science Osaka Institute Of Technology

• Shimizu R

  Osaka Univ. Osaka Jpn

• Shimizu Ryuichi

  Department Of Applied Physics Faculty Of Engineering Osaka University

• Kimura Yoshihide

  Department Of Applied Physics Faculty Of Engineering Osaka University

• Kawasaki Tadahiro

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• Kawasaki Tadahiro

  Department Of Material And Life Sciences Graduate School Of Engineering Osaka University

• Shimizu Ryuichi

  Department Of Applied Physics Faculty Engineering Osaka University

• Shimizu Ryuichi

  Department of Information Processing, Osaka Institute of Technology

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