高井義造 | Department Of Material And Life Science Graduate School Of Engineering Osaka University

スポンサーリンク

概要

関連著者

もっと見る

著作論文

High-Critical-Current-Density Epitaxial Films of SmBa_2Cu_3O_ in High Fields
Correlation between Film Thickness and Critical Current Density of Sm_Ba_Cu_3O_ Films Deposited by Pulsed Laser Deposition : Superconductors
Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images
Monte Carlo Study of X-ray Generation from Film/Substrate Structure by Electron Impact
Monte Carlo Modeling of Generation of Characteristic, Continuous and Fluorescent X-rays by Electron Impact
Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-Rays by Electron Impact (Short Note)
Fourier analysis of HRTEM image deterioration caused by mechanical vibration
Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum
Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
Flattening of Surface by Sputter-Etching with Low-Energy Ions : Instrumentation, Measurement, and Fabrication Technology
Monte Carlo Simulation Study of Backscattered Electron Imaging in a Chemical Vapor Deposition Scanning Electron Microscope
Floating-type Compact Low-energy Ion Gun - Basic Performance for High-resolution Depth Profiling -
Monte Carlo Simulation of Generations of Continuous and Characteristic X-Rays by Electron Impact
Optimization of voltage axis alignment in high-resolution electron microscopy
Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
Development of a real-time defocus image modulation processing electron microscope. I. Construction
TEM Study of the Interface Structure of CVD Diamond Heteroepitaxilly Grown on Pt(111) Substrate
単結晶LiTaO_3における分極反転ドメインの断面透過電子顕微鏡観察
Evaluation of image drift correction by three-dimensional Fourier analysis
Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
Cross-Sectional Transmission Electron Microscope Observation of Isolated Diamond Particles Heteroepitaxially Grown on Pt(111) Substrate
Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM
Effect of c-Axis-Correlated Disorders on the Vortex Diagram of the Pinning State
Enhancement of Flux-Pinning in Epitaxial Sm_Ba_Cu_3O_y Films by Introduction of Low-T_c Nanoparticles
High-Critical-Current-Density SmBa_2Cu_3O_ Films Induced by Surface Nanoparticle
Evidence of Mobile Ag and Growth Mechanism of YBa_2Cu_3O_7-y Films Deposited on Cube Textured Ag Tape by Chemical Vapor Deposition
Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy
Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method
Quantitative analysis of surface atom positions in a thick crystal as determined by a reconstructed exit wave

もっと見る

スポンサーリンク