Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method
スポンサーリンク
概要
- 論文の詳細を見る
- 2004-06-01
著者
-
高井 義造
Department Of Material And Life Science Graduate School Of Engineering Osaka University
-
Takai Yoshiaki
Depertment Of Electrical Engineering Nagoya University
-
Takai Yoshiaki
Nagoya University
-
KAWASAKI Tadahiro
Department of Material and Life Sciences, Graduate School of Engineering, Osaka University
-
Takai Yoshizo
Department Of Applied Physics Faculty Of Engineering Osaka University
-
TAYA Masaki
Department of Material and Life Science, Graduate School of Engineering, Osaka University
-
Kawasaki Tadahiro
Department Of Material And Life Science Graduate School Of Engineering Osaka University
-
Taya Masaki
Department Of Material And Life Science Graduate School Of Engineering Osaka University
関連論文
- Preparation of Y-Ba-Cu-O Thin Films by the CVD Method in a Vacuum-Evaporation-Type Reactor
- High-Quality Nb/AlO_x-Al/Nb Josephson Junctions with Gap Voltage of 2.95 mV
- High-Critical-Current-Density Epitaxial Films of SmBa_2Cu_3O_ in High Fields
- Correlation between Film Thickness and Critical Current Density of Sm_Ba_Cu_3O_ Films Deposited by Pulsed Laser Deposition : Superconductors
- Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images
- Monte Carlo Study of X-ray Generation from Film/Substrate Structure by Electron Impact
- Monte Carlo Modeling of Generation of Characteristic, Continuous and Fluorescent X-rays by Electron Impact
- Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-Rays by Electron Impact (Short Note)
- Fourier analysis of HRTEM image deterioration caused by mechanical vibration
- Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum
- Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
- Flattening of Surface by Sputter-Etching with Low-Energy Ions : Instrumentation, Measurement, and Fabrication Technology
- Monte Carlo Simulation Study of Backscattered Electron Imaging in a Chemical Vapor Deposition Scanning Electron Microscope
- Floating-type Compact Low-energy Ion Gun - Basic Performance for High-resolution Depth Profiling -
- Monte Carlo Simulation of Generations of Continuous and Characteristic X-Rays by Electron Impact
- Optimization of voltage axis alignment in high-resolution electron microscopy
- Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
- Development of a real-time defocus image modulation processing electron microscope. I. Construction
- TEM Study of the Interface Structure of CVD Diamond Heteroepitaxilly Grown on Pt(111) Substrate
- 単結晶LiTaO_3における分極反転ドメインの断面透過電子顕微鏡観察
- Evaluation of image drift correction by three-dimensional Fourier analysis
- Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
- Cross-Sectional Transmission Electron Microscope Observation of Isolated Diamond Particles Heteroepitaxially Grown on Pt(111) Substrate
- Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM
- 集束イオンビームによる断面TEM試料作製
- ダイヤモンドをよく知るために--評価法(16):透過型電子顕微鏡(2)試料作製法
- ダイヤモンドをよく知るために--評価法(16)透過型電子顕微鏡(1)概論
- 集束イオンビームでTEM用試料を作製したら
- Extraction of Spherical and Chromatic Aberration -free Information by Focal-depth Extension Processing Under Tilted Illumination
- Effect of c-Axis-Correlated Disorders on the Vortex Diagram of the Pinning State
- Histochemical Studies in Mouse Submaxillary Glands after Freezing
- Thermally Stimulated Current in Polyethylene Terephthalate Electrets Formed by AC Electrical Fields
- Electroluminescence in Polyethylene Terephthalate (PET). II. : AC Voltage
- Carrier Traps in Polyethylene Naphthalate (PEN): Photoelectret
- Electroluminescenee in Polyethylene Terephthalate (PET) I. : Impulse Voltage
- Thermally Stimulated Currents from Polyethylene Terephthalate due to Injected Charges
- Thermally Stimulated Currents in Photoelectrets of Polyethylene Terephthalate
- Enhancement of Flux-Pinning in Epitaxial Sm_Ba_Cu_3O_y Films by Introduction of Low-T_c Nanoparticles
- High-Critical-Current-Density SmBa_2Cu_3O_ Films Induced by Surface Nanoparticle
- Preparation of A-axis Oriented YBa_2Cu_3O_ Films by Metalorganic Chemical Vapor Deposition Using Liquid Sources
- Preparation of YBa_2Cu_3O_ Thin Films by Metal-Organic Chemical Vapor Deposition Using Liquid Sources
- Photovoltaic Cells of Merocyanine Dye Polymer Thin Films Prepared by Plasma Polymerization Method : Chemistry : incl. physical process
- Photoconduction in Polyvinyl Carbazole Thin Films Polymerized by Plasma-CVD
- Evidence of Mobile Ag and Growth Mechanism of YBa_2Cu_3O_7-y Films Deposited on Cube Textured Ag Tape by Chemical Vapor Deposition
- Spiral Growth of YBa_2Cu_3O_ Thin Films by Metalorganic Chemical Vapor Deposition Using Liquid-State Sources
- Temperature Dependence of Photocurrent in Polyethylene
- A Study on the Potential Structure of the Barrier in Ba_K_xBiO_3/Natural-Barrier/Au Structures
- Photoconduction in Polyimide (Kapton H)
- Improvement in Discharge Delay Time by Accumulating Positive Wall Charges on Cathode MgO Protective Layer Surface in Alternating-Current Plasma Display Panels
- Comparative Study on the Electronic Properties of p-Xylene Polymers Prepared by Plasma-Polymerization and Vapor Phase Pyrolysis
- Preparation of Phenylacetylene Polymer Thin Films by Photochemical Polymerization
- A Study on Carrier Traps in Plasma-Polymerized Phenylacetylene
- Electrical Conduction of Poly-P-Xylylene Thin Films on Si
- Electrical Properties of High-Molecular-Weight Poly-p-Phenylene Sulfide Films. : I. Photoconduction
- Thermally Deactivated-Type High Field Conduction in Poly-p-Xylylene Thin Films Polymerized in Vapor Phase
- Photogeneration of Charge Carriers in Polyimide Films
- Cross-Sectional Transmission Electron Microscopic Observation of Etch Hillocks and Etch Pits in LiTaO_3 Single Crystal
- Simultaneous Switching on Vertically Stacked Josephson Junctions with Very Thin Intermediate Electrode
- Magnetic Field Dependence of High J_c YBa_2Cu_3O_/Au/Nb Junctions Using a-Axis-Oriented YBa_2Cu_3O_ Thin Films
- Bismuth Valence Studies of As-Grown Superconducting Bi-Sr-Ca-Cu-O Thin Films with T_ from 98 K to 66 K
- High-T_c (95 K) As-Grown Superconducting Bi-Sr-Ca-Cu-O Thin Films
- Superconducting Properties of Y-Ba-Cu-O Thin Films Prepared by RF Magnetron Sputtering with a Grid Electrode
- Influence of Native Oxides on the Reliability of Ultrathin Gate Oxide
- Characterization of Silicon Native Oxide Formed in SC-1, H_2O_2 and Wet Ozone Processes
- Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels
- Deposition of Y-Ba-Cu-O Thin Films by RF Magnetron Sputtering with a Grid Electrode: Plasma Parameters
- Fabrication Process and Properties of Nb-InSb-Nb Planar Junction
- Submicrometer-Scale Patterning of Superconducting Nb Films Using Focused Ion Beam
- Fabrication of S-N-S Junction with the Normal Layer of InSb
- Investigation of Carrier Traps in Polyethylene by PSDC and TSC
- Carrier Traps in Poly-p-Xylylene Thin Films
- Carrier Traps in Poly-p-Xylylene Films
- High Field Conduction in Poly (p-xylylene) Thin Films
- Photoluminescence Study in Polymers
- Study on Electron Traps in Polyethylene Terephthalate by Thermally Stimulated Current and Photo-Stimulated Detrapping Current Analyses
- Photoconduction in Polyethylene Terephthalate. Mechanism of Photo-Carrier Transport.
- Investigation of Traps in γ-Irradiated Polyethylene by Photostimulated Detrapping Current Analysis
- Photodetrapping Currents in γ-Irradiated Polyethylene
- Characterization of Sc-O/W(100) Surface as Schottky Emitter : Work Function Change for Activation Processing
- Analysis of Dopant Concentration in Semiconductor Using Secondary Electron Method
- Development of coincidence transmission electron microscope. III. Incorporation with γ-type imaging energy filter
- Cross-sectional High-Resolution Transmission Electron Microscope Study of Heteroepitaxial Diamond Film Grown on Pt Substrate
- Experimental Analysis of YBa_2Cu_3O_x/Ag Proximity Interfaces
- Unique Method of Patterning Superconducting Thin Films by Selective Growth of Y-Ba-Cu-O
- Application of the Focused-Ion-Beam Technique for Preparing the Cross-Sectional Sample of Chemical Vapor Deposition Diamond Thin Film for High-Resolution Transmission Electron Microscope Observation
- Atmospheric Effects on Photoinjection Currents into Polyethylene Terephthalate
- Effects of Electrode Materials on Photocurrents in Polyethylene Terephthalate
- Ultraviolet Transient Photocurrents in Polyethylene with Zero External Field
- Photoconduction of Polyvinyl Chloride (PVC)
- Effects of γ-Ray Irradiation on Photoconduction of Polyethylene (PE)
- Electric Field and Polarity Dependence of Photocurrent in Polyethylene
- Y-Ba-Cu-O Superconducting Thin Films Prepared by Flash Evaporation : Electrical Properties of Condensed Matter
- Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy
- Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method
- Quantitative analysis of surface atom positions in a thick crystal as determined by a reconstructed exit wave
- Improvement of Thermoelectric Characteristic of [Ca2CoO3]x[CoO2] Thin Films by Controlling Their Microstructures
- Direct Observations of the Arrangement of Atoms around Stacking Faults and Twins in Gold Crystals and the Movement of Atoms Accompanying Their Formation and Disappearance
- Energy Distribution of Ion-Induced Secondary Electrons from MgO Surface
- Monte Carlo Study of X-ray Generation from Film/Substrate Structure by Electron Impact
- Extension of Atomic Mixing, Surface Roughness and Information Depth Model for Auger Electron Spectroscopy Sputter-Depth Profile Using Tilted Cylindrical Mirror Analyzer