Carrier Traps in Poly-p-Xylylene Films
スポンサーリンク
概要
- 論文の詳細を見る
The X-ray induced TSC and TL and the dielectric loss of the vapour-deposited poly-p-xylylene (PPX) film have been studied. The TSC in a PPX film with a prior X-ray irradiation showed five peaks, designated C_1 to C_5 and they were due to trapped carriers introduced by the X-ray irradiation. The C_2 and C_5 peaks corresponded to the dielectric loss peaks, the γ and β relaxations, suggesting the carrier detrapping assisted by the release of molecular motions. The C_1 peak suggested the existence of a new relaxation around 120 K. There were no relaxations corresponding to the C_3 and C_4 peaks and carriers were considered to be thermally released from traps whose depths were 0.5-0.6 eV.
- 社団法人応用物理学会の論文
- 1980-06-05
著者
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TAKAI Yoshiaki
Department of Electronics Engineering, Nagoya University
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Ieda M
Toyohashi Univ. Technol. Toyohashi Jpn
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Takai Yoshiaki
Depertment Of Electrical Engineering Nagoya University
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Takai Yoshiaki
Nagoya University
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Mizutani Teruyoshi
Department Of Electrical Engineering Aichi Institute Of Technology
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Ieda Masayuki
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Ishii Kazuhiro
Department Of Electrical Engineering Nagoya University
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Ieda M
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Ishii Kazuhiro
Department Of Cell Biology Institute For Virus Research Kyoto University
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Ieda M
Department Of Electrical Engineering Nagoya University:(present Address) Department Of Electrical En
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Mizutani Teruyoshi
Department of Electrical and Electronic Engineering, Aichi Institute of Technology, Toyota, Aichi 470-0529, Japan
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Takai Yoshiaki
Department of Electrical Engineering and Computer Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Ishii Kazuhiro
Department of Applied Chemistry, Faculty of Engineering, Osaka University
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