Determination of Trapping Parameters from TSC in Polyethylene
スポンサーリンク
概要
- 論文の詳細を見る
The trapping parameters of one of the carrier traps in low-density polyethylene were evaluated by using the X-ray-induced thermally-stimulated current (TSC) technique. The values obtained were E_t (trap depth): 0.90 eV, μτ (product of mobility and lifetime): 5×10^<-13>m^2/V and n_<to> (initial density of trapped carriers): 2.9×10^<20>m^<-3>. Assuming the fast retrapping case, N_t (trap density) was 1.4×10^<21>m^<-3> and, assuming the slow retrapping case, S_t (capture cross-section) and v (attempt-to-escape frequency) were 1.1×10^<-17>m^2 and 3×10^<13>sec^<-1>, respectively. Whether the retrapping was fast or slow, was not determined from the TSC results only.
- 社団法人応用物理学会の論文
- 1982-11-20
著者
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MIZUTANI Teruyoshi
Department of Electrical Engineering, Nagoya University
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IEDA Masayuki
Department of Electronics, Aichi Institute of Technology
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Ieda M
Toyohashi Univ. Technol. Toyohashi Jpn
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Mizutani Teruyoshi
Department Of Electrical Engineering Aichi Institute Of Technology
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Ieda M
Department Of Electronics Aichi Institute Of Technology
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Ieda Masayuki
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Hanai Masahiro
Department Of Electrical Engineering Nagoya University
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SUZUOKI Yasuo
Department of Electrical Engineering, Nagoya University
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Suzuoki Y
Center For Integrated Research In Science And Engineering Nagoya University
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Suzuoki Yasuo
Department Of Electrical Engineering Nagoya University
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Ieda M
Department Of Electrical Engineering Nagoya University:(present Address) Department Of Electrical En
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Suzuoki Yasuno
Department Of Electrical Engineering Nagoya University
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Mizutani Teruyoshi
Department of Electrical and Electronic Engineering, Aichi Institute of Technology, Toyota, Aichi 470-0529, Japan
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