Investigation of Carrier Traps in Polyethylene by PSDC and TSC

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概要

• 論文の詳細を見る

• The photo-stimulated detrapping currents from X-ray irradiated high-density polyethylene have been investigated. Comparing the results with those of TSC measurements, the optical depths of traps responsible for the TSC peaks have been determined. These depths are much larger than those estimated from TSC measurements and this can be explained by the erosion or destruction of traps by molecular motions.

• 社団法人応用物理学会の論文
• 1977-11-05

著者

• TAKAI Yoshiaki

  Department of Electronics Engineering, Nagoya University

• Ieda M

  Toyohashi Univ. Technol. Toyohashi Jpn

• Takai Yoshiaki

  Depertment Of Electrical Engineering Nagoya University

• Takai Yoshiaki

  Nagoya University

• Mizutani Teruyoshi

  Department Of Electrical Engineering Aichi Institute Of Technology

• Ieda Masayuki

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• SUZUOKI Yasuo

  Department of Electrical Engineering, Nagoya University

• Suzuoki Y

  Center For Integrated Research In Science And Engineering Nagoya University

• Suzuoki Yasuo

  Department Of Electrical Engineering Nagoya University

• Ieda M

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• Ieda M

  Department Of Electrical Engineering Nagoya University:(present Address) Department Of Electrical En

• Suzuoki Yasuno

  Department Of Electrical Engineering Nagoya University

• Mizutani Teruyoshi

  Department of Electrical and Electronic Engineering, Aichi Institute of Technology, Toyota, Aichi 470-0529, Japan

• Takai Yoshiaki

  Department of Electrical Engineering and Computer Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan

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