Takai Yoshizo | Department Of Applied Physics Faculty Of Engineering Osaka University

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概要

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著作論文

Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images
Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-Rays by Electron Impact (Short Note)
Fourier analysis of HRTEM image deterioration caused by mechanical vibration
Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum
Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
Flattening of Surface by Sputter-Etching with Low-Energy Ions : Instrumentation, Measurement, and Fabrication Technology
Optimization of voltage axis alignment in high-resolution electron microscopy
Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
Development of a real-time defocus image modulation processing electron microscope. I. Construction
TEM Study of the Interface Structure of CVD Diamond Heteroepitaxilly Grown on Pt(111) Substrate
Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
Cross-Sectional Transmission Electron Microscope Observation of Isolated Diamond Particles Heteroepitaxially Grown on Pt(111) Substrate
Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM
Extraction of Spherical and Chromatic Aberration -free Information by Focal-depth Extension Processing Under Tilted Illumination
Improvement in Discharge Delay Time by Accumulating Positive Wall Charges on Cathode MgO Protective Layer Surface in Alternating-Current Plasma Display Panels
Cross-Sectional Transmission Electron Microscopic Observation of Etch Hillocks and Etch Pits in LiTaO_3 Single Crystal
Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels
Characterization of Sc-O/W(100) Surface as Schottky Emitter : Work Function Change for Activation Processing
Analysis of Dopant Concentration in Semiconductor Using Secondary Electron Method
Development of coincidence transmission electron microscope. III. Incorporation with γ-type imaging energy filter
Cross-sectional High-Resolution Transmission Electron Microscope Study of Heteroepitaxial Diamond Film Grown on Pt Substrate
Application of the Focused-Ion-Beam Technique for Preparing the Cross-Sectional Sample of Chemical Vapor Deposition Diamond Thin Film for High-Resolution Transmission Electron Microscope Observation
Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy
Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method
Quantitative analysis of surface atom positions in a thick crystal as determined by a reconstructed exit wave
Direct Observations of the Arrangement of Atoms around Stacking Faults and Twins in Gold Crystals and the Movement of Atoms Accompanying Their Formation and Disappearance
Energy Distribution of Ion-Induced Secondary Electrons from MgO Surface
Monte Carlo Study of X-ray Generation from Film/Substrate Structure by Electron Impact
Extension of Atomic Mixing, Surface Roughness and Information Depth Model for Auger Electron Spectroscopy Sputter-Depth Profile Using Tilted Cylindrical Mirror Analyzer
Monte Carlo Simulation Study of Backscattered Electron Imaging in a Chemical Vapor Deposition Scanning Electron Microscope
Monte Carlo Modeling of Generation of Characteristic, Continuous and Fluorescent X-rays by Electron Impact
Surface Structure of Sc-O/W(100) System used as Schottky Emitter at High Temperature
Sputter Depth Profiling of Multiple Short-Period BN $\mathbf{\delta}$-Doped Si by Work Function Measurement

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