ICHIHASHI Mikio | Instrument Division, Hitachi Ltd
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概要
関連著者
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生田 孝
大阪電通大
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高井 義造
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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生田 孝
大阪歯科大学 口腔解剖
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Takai Yoshiaki
Depertment Of Electrical Engineering Nagoya University
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Takai Yoshiaki
Nagoya University
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SHIMIZU Ryuichi
Department of Applied Physics, Osaka University
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木村 吉秀
阪大院・工
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KIMURA Yoshihide
Department of Applied Physics, Osaka University
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TAKAI Yoshizo
Department of Material and Life Sciences, Graduate School of Engineering, Osaka University
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IKUTA Takashi
Osaka Electro-Communication University
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ICHIHASHI Mikio
Instrument Division, Hitachi Ltd
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SATOU Yuji
Instrument Division, Hitachi Ltd
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木村 吉秀
大阪大 大学院工学研究科
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Satou Yuji
Instrument Division Hitachi Ltd
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Souda R
National Institute For Research In Inorganic Materials
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Takai Yoshizo
Department Of Applied Physics Faculty Of Engineering Osaka University
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Shimizu R
Department Of Information Science Osaka Institute Of Technology
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Shimizu R
Osaka Univ. Osaka Jpn
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Shimizu Ryuichi
Department Of Applied Physics Faculty Of Engineering Osaka University
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Kimura Yoshihide
Department Of Applied Physics Faculty Of Engineering Osaka University
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Ichihashi Mikio
Instrument Division Hitachi Ltd
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Isakozawa Shigeto
Instrument Division Hitachi Ltd
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Shimizu Ryuichi
Department Of Applied Physics Faculty Engineering Osaka University
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Shimizu Ryuichi
Department of Information Processing, Osaka Institute of Technology
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KAWASAKI Tadahiro
Department of Material and Life Sciences, Graduate School of Engineering, Osaka University
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SATO Yuji
Instrument Division, Hitachi Ltd
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ISAKOZAWA Shigehito
Instrument Division, Hitachi Ltd
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ISAKOZAWA Shigeto
Instrument Division, Hitachi Ltd
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Kawasaki Tadahiro
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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Kawasaki Tadahiro
Department Of Material And Life Sciences Graduate School Of Engineering Osaka University
著作論文
- Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
- Development of a real-time defocus image modulation processing electron microscope. I. Construction