In-situ, analytical, high-voltage and high-resolution transmission electron microscopy of Xe ion implantation into Al
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1999-10-01
著者
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SONG Minghui
Okayama University of Science
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FURUYA Kazuo
National Research Institute for Metals
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SAITO Tetsuya
National Research Institute for Metals
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Song Minghui
Advanced Nano Characterization Center National Institute For Materials Science
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Furuya Kazuo
National Institute For Materials Science
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Furuya Kazuo
High Voltage Electron Microscopy Station National Institute For Materials Science
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Song Minghui
High Voltage Electron Microscopy Station National Institute For Materials Science
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MITSUISHI Kazutaka
National Institute for Materials Science
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SONG Minghui
National Institute for Materials Science
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Furuya K
National Institute For Materials Science
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Furuya Kazuo
Advanced Nano Characterization Center National Institute For Materials Science
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Mitsuishi K
National Institute For Materials Science
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Sato T
Niigata Univ. Niigata Jpn
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Saito Tetsuya
National Institute For Materials Science
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