Development of Three-Dimensional Ultrasonic Simulation and Its Application

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Formation of Au and AuSi_x-Pyramids in Separation by Implanted Oxygen Wafers with Si Pillars in SiO_2 Layer
Fatigue Process Evaluation of Ultrasonic Fatigue Testing in High Strength Steel Analyzed by Acoustic Emission and Non-Linear Ultrasonic
Practical Performance of Energy-Dispersive X-Ray Spectroscopy with a High-Voltage TEM up to 1,000kV
Development of Simplified Ultrasonic CT System for Imaging of Weld Metal and It's Comparison with TOFD Method(Experimental Mechanics)
Ultrasonic Imaging of Welded Metals Using Simplified Ultrasonic Computerized Tomography(Instrumentation, Measurement, and Fabrication Technology)
Optical Absorption Spectra in Cobalt-Substituted Epitaxial Magnetic Garnet Films Measured with Photothermal Deflection Spectroscopy
Studies of Boron Segregation to {311} Defects in Silicon-Implanted Silicon
Boron Segregation to {311} Defects Induced by Self-Implantation Damage in Si
Boron Accumulation in the {311} Defect Region Induced by Self-Implantation into Silicon Substrate
The Role of Gallium Antisite Defect in Activation and Type-Conversion in Si Implanted GaAs
Rapid Thermal Annealing of Si^+ Implanted GaAs in the Presence of Arsenic Pressure by GaAs Powder
Finite Difference Method Analysis of Ultrasonic Nonlinearity in Partially Degraded Material
Research on the Nondestructive Measurement of Nonlinear Elastic Modulus by Using Ultrasonic Wave
Noncontact Ultrasonic Imaging of Subsurface Defects Using a Laser-Ultrasonic Technique
Development of Three-Dimensional Ultrasonic Simulation and Its Application
Surface Channel Metal Gate Complementary MOS with Light Counter Doping and Single Work Function Gate Electrode
Sub-1.3 nm Amorphous Tantalum Pentoxide Gate Dielectrics for Damascene Metal Gate Transistors
Sub 1.3nm Amorphous Ta_2O_5 Gate Dielectrics for Damascene Metal Gate Transistor
Highly Uniform Low-Pressure Chemical Vapor Deposition (LP-CVD) of Si_3N_4 Film on Tungsten for Advanced Low-Resistivity "Polymetal" Gate Interconnects
Plasma-Damage-Free Gate Process Using Chemical Mechanical Polishing for 0.1 μm MOSFETs
Plasma Damage Free Gate Process Using CMP for 0.1um MOSFETs
SCC Monitoring of Chloride Droplets on Thin SUS304 Plate Specimens by Analysis of Continuous Recorded AE Waveform
Structural Properties of Amorphous Carbon Nitride Films Prepared by Reactive RF-Magnetron Sputtering
Magnetic Properties and Magnetoresistance of Granular Evaporated Fe/Si Films
The Exchange-Coupled Field in NiO/Ni Double Layer on Silica Substrates
Effects of Cleavage on Local Cross-Sectional Stress Distribution in Trench Isolation Structure
Ternperature Dependence of Faraday Rotation in Co^2+-Substituted Hexaferrites
Main Cause of Surface Waveguides Formed under LiNbO_3 Crystal Surface during Thermal Treatment
Effects of Cleavage on Local Cross-Sectional Stress Distribution in Trench Isolation Structure
Exchange Coupling in NiO/Ni Double Layer Films
In Situ Transmission Electron Microscopy Observation of Au-Si Interface Reaction
Calculation of Absorption Spectra of YBa_2Cu_3O_ by Means of Xα Method
Prevention of Thermal Degradations by Using Dehydrated LiNbO_3 Crystal
Root Growth-promoting Activities of N-Acyl-L-proline Derivatives
In-situ, analytical, high-voltage and high-resolution transmission electron microscopy of Xe ion implantation into Al
Characterization of the Internal Friction Properties of 2.25Cr-1Mo Steel
A Calculation of Electronic States in YBa_2Cu_3O_y
Growth of Ce-Substituted Yttrium Iron Garnet Films by MoO_3-K_2MoO_4-Y_2O_3 Flux and Their Faraday Rotation Spectra
A Hypothesis of Non-Propagating Fatigue Crack
Detection of Ultrasonic Longitudinal and Shear Waves Using Optical Heterodyne Interferometer
Anomalous Exciton Absorption in PbI_2 Films Produced via Amorphous-To-Crystalline Transformation
Optical Characterization of Amorphous PbI_2 Films and Their Crystallization
In-situ Observation of Focused Ion Beam Micropatterns on Semiconductors and Insulators
Application of the Hypothesis of Non-Propagating Fatigue Crack to the Push-Pull Fatigue Testing of an Infinite Plate with an Elliptical Hole Notch
In Situ Microlithography of Si and GaAs by a Focused Ion Beam in a 200keV TEM
Noncontact Ultrasonic Imaging of Subsurface Defects Using a Laser-Ultrasonic Technique
In-Situ Observation and Acoustic Emission Analysis for Corrosion Pitting of MgCl_2 Droplet in SUS304 Stainless Steel
Determination of dynamic elastic-plastic fracture toughness by a drop-weight impact testing machine.

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