High-resolution electron microscopy study of defect structures in γ-TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1999-08-01
著者
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Nozawa Takashi
Institute Of Advanced Energy Kyoto University
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SONG Minghui
Okayama University of Science
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FURUYA Kazuo
National Research Institute for Metals
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NODA Tetsuji
National Institute for Materials Science
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Song Minghui
Advanced Nano Characterization Center National Institute For Materials Science
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Noda T
National Institute For Materials Science
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Furuya Kazuo
National Institute For Materials Science
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Furuya Kazuo
High Voltage Electron Microscopy Station National Institute For Materials Science
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Song Minghui
High Voltage Electron Microscopy Station National Institute For Materials Science
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SONG Minghui
National Institute for Materials Science
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TANABE Tatsuhiko
National Research Institute for Metals
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Furuya K
National Institute For Materials Science
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Furuya Kazuo
Advanced Nano Characterization Center National Institute For Materials Science
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Noda Tetsuji
National Inst. For Materials Sci. Tsukuba Jpn
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