Three-dimensional imaging of carbon nanostructures by scanning confocal electron microscopy
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概要
著者
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HASHIMOTO Ayako
Kanagawa Academy of Science and Technology
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Mitsuishi K
National Institute For Materials Science
関連論文
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- Effect of Electrification Conditions on the Freezing of Supercooled Water Droplets on a Hydrophobic Coating
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- Direct Observation of Water Droplet Motion on a Hydrophobic Self-assembled Monolayer Surface under Airflow
- Fabrication of Free-Standing Tungsten-Nanowhiskers on SiO_2 Substrates with Electron-Beam Induced Deposition
- Fabrication and Characterization of Self-Standing W-Nanodendrites on Insulator SiO_2 Substrate by Electron-Beam-Induced Deposition under HVTEM
- Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filtering
- Effect of Mg on the Sintering of Al-Mg Alloy Powders by Pulse Electric-Current Sintering Process
- Dynamic process of nano-structured inert gas precipitates introduced with ion implantation in aluminium (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- Effect of Interface Behavior between Particles on Properties of Pure Al Powder Compacts by Spark Plasma Sintering
- In-situ, analytical, high-voltage and high-resolution transmission electron microscopy of Xe ion implantation into Al
- Xe precipitates at grain boundaries in Al under 1 MeV electron irradiation
- Three-dimensional imaging of carbon nanostructures by scanning confocal electron microscopy
- Development of a stage-scanning system for high-resolution confocal STEM
- Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis
- Proximity Effect in Electron-Beam-Induced Deposition
- Morphology of Iron Silicide Nanorods Formed by Electron-Beam-Induced Deposition Using Ultrahigh-Vacuum Transmission Electron Microscope
- Amorphous-like nanostructures stabilized in nanometre-sized alloy clusters (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS waves
- Fabrication and investigation of tungsten deposit on top and bottom surfaces of thin film substrate (Special issue: Microprocesses & nanotechnology)
- Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images