Takeguchi Masaki | National Institute for Material Science, 3-13 Sakura, Tsukuba 305-0003, Japan

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著作論文

Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis
Proximity Effect in Electron-Beam-Induced Deposition
High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface
New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS waves
Structure Study of Si Nanocrystals Formed by Electron-Induced Reduction of SiO_2 at High Temperature
High Resolution Transmission Electron Microscopy Study on the Structure of Ge Nanoparticles by Using an Ultrahigh Vacuum-Molecular Beam Epitaxy-Transmission Electron Microscope System
Electron-Beam-Induced Deposition of Fe Nanoparticles and Thin Films on SrTiO3 Substrates
Resolution in New Nanofabrication Technique Combining Electron-Beam-Induced Deposition and Low-Energy Ion Milling
Efficient Production of Single-Walled Carbon Nanotubes by $\mathbf{J} \times \mathbf{B}$ Gas-Arc Method

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