Biatomic Layer-High Steps on Si(001)2×1 Surface

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1987-04-20

著者

• NAKAYAMA Tsuneyosi

  Department of Applied Physics, Hokkaido University

• TAKAYANAGI Kunio

  Physics Department, Tokyo Institute of Technology

• Takayanagi Kunio

  Physics Department Tokyo Institute Of Technology

• Takayanagi Kunio

  Department Of Materials Science And Engeneering Interdisciplinary Graduate School Of Science And Eng

• Nakayama Tsuneyosi

  Department Of Applied Physics Hokkaido University

• TANISHIRO Yasumasa

  Physics Department, Tokyo Institute of Technology

• Tanishiro Y

  Physics Department Tokyo Institute Of Technology

• NAKAYAMA Tomonobu

  Physics Department, Tokyo Institute of Technology

• Tanishiro Yasumasa

  Physics Department Tokyo Institute Of Technology

関連論文

• Kapitza Resistance between Sintered Metal Particles and ^3He-^4He Mixture : I. QUANTUM LIQUIDS AND SOLIDS : Interfaces of He
• 22aT-13 High resolution REM study on structures of high index Si surfaces induced by metal deposition
• Fabrication of Gold Nanowires Using Contact Mode Atomic Force Microscope
• Surface Structures Observed by High-Resolution UHV Electron Microscopy at Atomic Level
• Magnetocaloric Effect of Super-paramagnetic Nanocomposite Composed of Iron-Oxide and Silver
• Formation of Iron-Nitride/Silver Nanocomposites by Ammonia-Flow Method and Nitride Phase Identification by X-Ray Absorption Near-Edge Structure
• Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
• Preparation and Time-Resolved Photoluminescenee Study of CdTe/Cd_Mn_xTe Single Quantum Wells
• Pressure-Induced Type I-Type II Crossover in AlAs/GaAs Short-Period Superlattices
• New Phase Diagram of Step Instabilities on Si(111) Vicinal Surfaces Induced by DC Annealing : Condensed Matter: Structure, etc.
• Energy-filtered Electron Interferometry in Reflection Electron Microscopy
• Design features of a new ultra-high vacuum electron microscope with an omega filter
• Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces
• Ultra High Vacuum Reflection Electron Microscopy Study of Step-Dislocation Interaction on Si(111) Surface
• UHV-TEM-REM Studies of Si(111) Surfaces
• A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces
• Monolayer and Bilayer High Steps on Si(001)2×1 Vicinal Surface
• Biatomic Layer-High Steps on Si(001)2×1 Surface
• Atomic Resolution TEM Images of the Au(001) Reconstructed Surface
• In-Plane Photocurrent Spectroscopy of Undoped GaAs/AlAs Quantum Well Heterostructures : Surfaces, Interfaces and Films
• Elastic Vibrations of Fractal Networks
• Effect of Oxygen Stoichiometry for Anisotropic Structural Change in Oriented YBa_2Cu_3O_x : Electrical Properties Condensed Matter
• An Ion-Sputtering Gun to Clean Crystal Surfaces In-Situ in an Ultra-High-Vacuum Electron Microscope
• Electron Beam Evaporator for In Situ Deposition Studies of Refractory Metal Thin Films in UHV Electron Microscope
• Contrast of Closely Spaced Misfit Dislocations
• On the Growth Feature of Sn Deposit on SnTe Substrate
• Restructuring of the Reconstructed Si(111)7×7 Surface by Metal(Au, Ag) Deposition
• Fabrication of Gold Nanowires Using Contact Mode Atomic Force Microscope
• Energy-filtered Electron Interferometry in Reflection Electron Microscopy

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