Fabrication of Gold Nanowires Using Contact Mode Atomic Force Microscope
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概要
- 論文の詳細を見る
Gold nanowires were fabricated using a contact mode atomic force microscope (AFM), the tip of which scans a thin gold layer predeposited on a mica substrate. The nanowires are spaced with an interval in the range of 130–590 nm. Their widths and heights are distributed in the range of 70–110 nm and 4–7 nm, respectively. By adjusting the strength of the force applied by the AFM tip, the spacing, width and height of the nanowires can be controlled and made to increase as the applied force increases. Scanning an extensional area enabled us to fabricate long nanowires.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-09-15
著者
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WATANABE Manabu
Physics Department, Tokyo Institute of Technology
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Takayanagi Kunio
Physics Department Tokyo Institute Of Technology
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Minoda Hiroki
Physics Department Tokyo Institute Of Technology
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Takayanagi Kunio
Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro, Tokyo 152-8551 Japan
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Minoda Hiroki
Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro, Tokyo 152-8551 Japan
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Watanabe Manabu
Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro, Tokyo 152-8551 Japan
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