A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1990-04-20
著者
-
Yagi Katsumichi
Physics Department,Tokyo Institute of Technology
-
Yamanaka Akira
Physics Department Tokyo Institute Of Technology
-
TANISHIRO Yasumasa
Physics Department, Tokyo Institute of Technology
-
Tanishiro Y
Physics Department Tokyo Institute Of Technology
-
OZAWA Soh-ichiro
Physics Department, Tokyo Institute of Technology
-
KOBAYASHI Kunio
Physics Department, Tokyo Institute of Technology
-
Ozawa Sho-ichiro
Physics Department Tokyo Institute Of Technology
-
Tanishiro Yasumasa
Physics Department Tokyo Institute Of Technology
-
Yagi Katsumichi
Physics Department Tokyo Institute Of Technology
-
Kobayashi Kunio
Physics Department Tokyo Institute Of Technology
-
YAMANAKA Akira
Physics Department, Tokyo Institute of Technology
関連論文
- 22aT-13 High resolution REM study on structures of high index Si surfaces induced by metal deposition
- Surface Structures Observed by High-Resolution UHV Electron Microscopy at Atomic Level
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- New Phase Diagram of Step Instabilities on Si(111) Vicinal Surfaces Induced by DC Annealing : Condensed Matter: Structure, etc.
- Energy-filtered Electron Interferometry in Reflection Electron Microscopy
- Design features of a new ultra-high vacuum electron microscope with an omega filter
- Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces
- Ultra High Vacuum Reflection Electron Microscopy Study of Step-Dislocation Interaction on Si(111) Surface
- UHV-TEM-REM Studies of Si(111) Surfaces
- A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces
- Monolayer and Bilayer High Steps on Si(001)2×1 Vicinal Surface
- Biatomic Layer-High Steps on Si(001)2×1 Surface
- Atomic Resolution TEM Images of the Au(001) Reconstructed Surface
- Epitaxy of Au and Ag on Cleaved (10, 0) Surface of MoS_2 : Surfaces, Interfaces and Films
- Electron Microscope Study on Commensurate-Incommensurate Phase Transition of Rb_2ZnCl_4 Crystals
- An Ion-Sputtering Gun to Clean Crystal Surfaces In-Situ in an Ultra-High-Vacuum Electron Microscope
- Electron Beam Evaporator for In Situ Deposition Studies of Refractory Metal Thin Films in UHV Electron Microscope
- Contrast of Closely Spaced Misfit Dislocations
- On the Growth Feature of Sn Deposit on SnTe Substrate
- Reflection Electron Microscope Observations of Dislocations and Surface Structure Phase Transition on Clean (111) Silicon Surfaces
- Preferential Diffusion of Vacancies Perpendicular to the Dimers on Si(001)2 × 1 Surfaces Studied by UHV REM
- REM Observation on Conversion between Single-Domain Surfaces of Si(001) 2 × 1 and 1 × 2 Induced by Specimen Heating Current
- Energy-filtered Electron Interferometry in Reflection Electron Microscopy
- High-Resolution Reflection Electron Microscopy of Si(111)$7\times 7$ Surfaces Using a High-Voltage Electron Microscope