A Model of Carrier Capturing and Recombination Process in Quantum-Dot System : Influence of Excitation Power on Spontaneous Emission Intensity and Lifetime

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概要

• 論文の詳細を見る
• 2000-08-28

著者

• NAKATA Yoshiaki

  Fujitsu Laboratories Ltd.

• Sugawara Mitsuru

  Fujitsu Limited And Fujitsu Laboratories Limited

• Sugawara Mitsuru

  北海道大学 薬学研究臨床薬剤学

• Nakata Y

  Fujitsu Ltd. Atsugi Jpn

• MUKAI Kohki

  Fujitsu Laboratories Ltd.

• MUKAI Kohki

  Optical Semiconductor Devices Labs, Fujitsu Laboratories Ltd.

• Mukai K

  Univ. Tokyo Chiba Jpn

• Nishikawa Y

  Toshiba Corp. Kawasaki Jpn

• Nishikawa Y

  Materials And Devices Research Laboratories Toshiba Corporation

• Nishikawa Yukie

  Advanced Lsi Technology Laboratory Corporate Research & Development Center Toshiba Corporation

• Nishikawa Yukie

  Corporate Research & Development Center Toshiba Corporation

• Sugawara Mitsuru

  Fujitsu Laboratories Ltd.

• Sugawara M

  Fujitsu Laboratories Ltd.

• Nakata Yoshinori

  Microgravity Materials Science Group Institute For Materials And Chemical Process National Institute

• Nakata Y

  Fujitsu Laboratories Ltd.

• Sugawara M

  Semiconductor Company Sony Corporation

• Sugawara M

  Fujitsu Limited And Fujitsu Laboratories Limited

• Nakata Yoshiaki

  Fujitsu Laboratories Limited

• Sugawara Mitsuru

  Fujitsu and Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan

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