Kageshima Hiroyuki | Ntt Basic Research Laboratories
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概要
関連著者
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Kageshima Hiroyuki
Ntt Basic Research Laboratories
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KAGESHIMA Hiroyuki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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SHIRAISHI Kenji
NTT Basic Research Laboratories
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Uematsu Masashi
Ntt Basic Research Laboratories
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Hibino Hiroki
Ntt Basic Research Laboratories
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KAGESHIMA Hiroyuki
NTT LSI Laboratories
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Shiraishi K
Institute Of Physics University Of Tsukuba
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Nagase Masao
Ntt Basic Research Laboratories
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UEMATSU Masashi
NTT Basic Research Laboratories, NTT Corporation
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YAMAGUCHI Hiroshi
NTT Basic Research Laboratories
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Shiraishi K
Institute Of Physics Tsukuba University
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Shiraishi K
Japan Atomic Energy Res. Inst. Gunma Jpn
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Akiyama Toru
Department Of Orthopaedic Surgery Faculty Of Medicine The University Of Tokyo
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Sekine Yoshiaki
Ntt Basic Research Laboratories Nippon Telegraph And Telephone Corporation
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Nagase Masao
Ntt Basic Research Laboratories Nippon Telegraph And Telephone Corporation
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Hibino Hiroki
Ntt Basic Research Laboratories Nippon Telegraph And Telephone Corporation
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Kageshima Hiroyuki
Ntt Basic Research Laboratories Nippon Telegraph And Telephone Corporation
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Uematsu M
Ntt Basic Research Laboratories Ntt Corporation
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Uematsu Masaya
NTT Basic Research Laboratories, NTT Corporation
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HIBINO Hiroki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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Ito Tomonori
Department Of Chemical And Biochemical Engineering Faculty Of Engineering Toyama University
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Tanabe Shinichi
Ntt Basic Research Laboratories Nippon Telegraph And Telephone Corporation
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Shiraishi Kenji
Institute Of Physics University Of Tsukuba
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Takahashi Yasuo
Ntt Basic Research Laboratories Ntt Corporation
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Uematsu Masahi
Ntt Basic Research Laboratories Ntt Corporation
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Yamaguchi Hiroshi
Ntt Basic Research Laboratories Nippon Telegraph And Telephone Corp.
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Nagase Masao
Faculty of Engineering, The University of Tokushima, Tokushima 770-8506, Japan
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HORIGUCHI Seishi
Optoelectronics Joint Research Laboratory
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TANABE Shinichi
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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Horiguchi Seiji
Ntt Basic Research Laboratories
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Horiguchi Seiji
Ntt Basic Research Laboratories Ntt Corporation
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Kasu Makoto
Ntt Basic Research Laboratories
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Nagase M
Ntt Basic Research Laboratories Ntt Corporation
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Takahashi Y
Ntt Basic Research Laboratories Ntt Cornoration
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Takahashi Y
Osaka University
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TAKAHASHI Yasuo
NTT Basic Research Laboratories, NTT Corporation
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Itoh Kohei
Department Of Applied Physics And Physico-informatics And Crest-jst Keio University
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MURASE Katsumi
NTT Basic Research Laboratories, NTT Corporation
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Murase Katsumi
Ntt Basic Research Laboratories Ntt Corporation:(present)ntt Electronics Corporation (nel)
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Fujiwara Akira
Ntt Basic Research Laboratories Ntt Corporation
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Fukatsu Shigeto
Department Of Applied Physics And Physico-informatics And Crest-jst Keio University
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Kageshima Hiroyuki
Ntt Basic Research Laboratories Ntt Corporation
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Ohta Eiji
Department Of Agricultural Chemistry Faculty Of Agriculture Kyoto University
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Takahashi Yasuo
The Tokyo Metropolitan Research Laboratory Of Public Health:graduate School Of Nutritional And Envir
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Yabuuchi Shin
Department Of Applied Physics And Physico-informatics Faculty Of Science And Technology Keio Univers
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Takahashi Yasuo
Faculty Of Pharmaceutical Sciences Tokyo University Of Science
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Horiguchi Seiji
Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University
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Kageshima Hiroyuki
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Kageshima Hiroyuki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Itoh Kohei
Department of Applied Physics and CREST-JST, Keio University, Yokohama 223-8522, Japan
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AKIYAMA TORU
Department of Orthopaedic Surgery, Faculty of Medicine, The University of Tokyo
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SEKINE Yoshiaki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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Ono Yukinori
NTT Basic Research Laboratories
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Inokawa Hiroshi
Ntt Basic Research Laboratories Ntt Corporation
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TAKAHASHI Yasuo
Graduate School of Information Science and Technology, Hokkaido University
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SATO Tetsuya
Department of Pediatrics, Kochi Medical School, Kochi University
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Takahashi Y
Hokkaido Univ. Sapporo‐shi Jpn
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Kasu Makoto
Ntt Basic Research Laboratories Ntt Corporation
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Akiyama Toru
Department Of Physics Engineering Mie University
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Akiyama Toru
Mie Univ. Tsu Jpn
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Akiyama Toru
Dept. Of Physics Engineering Mie Univ.
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Sato Tetsuya
Department Of Cardiology Okayama Red Cross General Hospital
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SHIRAISHI Kenji
Institute of Physics, University of Tsukuba
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UEDA Kenji
NTT Basic Research Laboratories, NTT Corporation
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YAMAUCHI Yoshiharu
NTT Basic Research Laboratories, NTT Corporation
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Ito Tomonori
Ntt System Electronics Laboratories
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ITO Tomonori
Dept. of Physics Engineering, Mie Univ.
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UEMATSU Masahi
NTT Basic Research Laboratories, NTT Corporation
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AKAGI Kazuto
Department of Physics, University of Tokyo
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TSUNEYUKI Shinji
Department of Physics, University of Tokyo
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SHIRAISHI Kenji
Department of Physics, University of Tsukuba
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UCHIDA Kazuyuki
NTT Basic Research Laboratories, NTT Corporation
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Takahashi Y
Graduate School Of Information Science And Technology Hokkaido Univ.
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Kakimoto Koichi
Research Instittue For Applied Mechanics Kyushu University
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Takahashi Tomonori
Department Of Applied Physics And Physico-informatics And Crest-jst Keio University
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Takahashi Y
Department Of Applied Physics School Of Engineering Tohoku University
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Ito Tomonori
Dept. Of Physics Engineering Mie Univ.
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Harada Yuichi
Ntt Basic Research Laboratories
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OHNO Satoru
Department of Physics, Faculty of Science, Niigata University
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SUZUKI Yasuo
NTT Basic Research Laboratories
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Ohno Satoru
Department Of Applied Physics And Physico-informatics Faculty Of Science And Technology Keio Univers
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OBA Yojiro
Department of Applied Physics and Physico-Informatics, Faculty of Science and Technology, Keio Unive
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YABUUCHI Shin
Department of Applied Physics and Physico-Informatics, Faculty of Science and Technology, Keio Unive
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Oba Yojiro
Department Of Applied Physics And Physico-informatics Faculty Of Science And Technology Keio Univers
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Akagi Kazuto
Department Of Physics University Of Tokyo
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Tsuneyuki Shinji
Department Of Physics University Of Tokyo
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Yamauchi Yoshiharu
Ntt Basic Research Laboratories
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Ito Tomonori
Ntt System Electroncis Laboratories
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Ueda Kenji
Ntt Basic Research Laboratories Ntt Corporation
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Shiraishi Kenji
Graduate School Of Applied Physics Univ Of Tsukuba
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Shiraishi Kenji
Department Of Physics Faculty Of Science And Technology Keio University
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Shiraishi Kenji
Department Of Physics University Of Tsukuba
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Sato Tetsuya
Department Of Applied Physics And Physico-informatics Faculty Of Science And Technology Keio Univers
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Sato Tetsuya
Department Of Agricultural Chemistry Obihiro University Of Agriculture And Veterinary Medicine
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Hibino Hiroki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Wakabayashi Katsunori
International Center for Materialas Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
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Wakabayashi Katsunori
International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan
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Akiyama Toru
Department of Physics Engineering, Mie University, 1515 Kamihama, Tsu, Mie 514-8507, Japan
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Sekine Yoshiaki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Kangawa Yoshihiro
Research Institute for Applied Mechanics, Kyushu University, Kasuga, Fukuoka 816-8580, Japan
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Kageshima Hiroyuki
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Kageshima Hiroyuki
NTT Basic Research Laboratories, NTT Corporation, Atsugi 243-0198, Japan
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Kageshima Hiroyuki
NTT Basic Research Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan
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Yabuuchi Shin
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Ohta Eiji
Department of Applied Physics and Physico-Informatics, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
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Takahashi Tomonori
Department of Applied Physics and Physico-Informatics and CREST-JST, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
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Uematsu Masashi
Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku, Yokohama 223-8522, Japan
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Uematsu Masashi
NTT Basic Research Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Uematsu Masashi
NTT Basic Research Laboratories, NTT Corporation, Atsugi 243-0198, Japan
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Uematsu Masashi
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Uematsu Masahi
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Tanabe Shinichi
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Ito Tomonori
Department of Physics Engineering, Mie University, 1515 Kamihama, Tsu 514-8507, Japan
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Shiraishi Kenji
NTT Basic Research Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Shiraishi Kenji
Institute of Physics, University of Tsukuba, Tsukuba 305-8571, Japan
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Shiraishi Kenji
Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8571, Japan
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Nagase Masao
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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INOUE Masato
Deparatment of Occupational Health, Graduate School of Medicine, Gifu University
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Itoh Kohei
Department of Applied Physics and Physico-Informatics and CREST-JST, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
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Akagi Kazuto
Graduate School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-0033, Japan
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Tsuneyuki Shinji
Graduate School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-0033, Japan
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Takamura Makoto
NTT Basic Research Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan
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Shiraishi Kenji
Institute of Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8577, Japan
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Yabuuchi Shin
Department of Applied Physics and Physico-Informatics, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
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Inoue Masato
Department of Aeronautics and Astronautics, Kyushu University, Kasuga, Fukuoka 816-8580, Japan
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Kageshima Hiroyuki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan
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Nagase Masao
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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HARADA Yuichi
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
著作論文
- Half-Integer Quantum Hall Effect in Gate-Controlled Epitaxial Graphene Devices
- RF Equivalent-Circuit Analysis of p-Type Diamond Field-Effect Transistors with Hydrogen Surface Termination
- Mechanism of Potential Profile Formation in Silicon Single-Electron Transistors Fabricated Using Pattern-Dependent Oxidation : Semiconductors
- Effect of Oxidation-Induced Strain on Potential Profile in Si SETs Using Pattern-Dependent Oxidation (PADOX)
- Microscopic Mechanism of Oxygen Transport during Thermal Silicon Oxidation
- Theoretical Study of Excess Si Emitted from Si-oxide/Si Interfaces
- Interfacial Silicon Emission in Dry Oxidation-the Effect of H and Cl
- Interfacial Silicon Emission in Dry Oxidation -the Effect of H and Cl
- Oxidation Simulation of Heavily Phosphorus-Doped Silicon based on the Interfacial Silicon Emission Model : Semiconductors
- Phenomenological Theory on Si Layer-by-Layer Oxidation with Small Interfacial Islands
- Oxidation Simulation of (111) and (100) Silicon Substrates Based on the Interfacial Silicon Emission Model
- Simulation of High-Pressure Oxidation of Silicon Based on the Interfacial Silicon Emission Model
- Unified Simulation of Silicon Oxidation Based on the Interfacial Silicon Emission Model
- Universal Theory of Si Oxidation Rate and Importance of Interfacial Si Emission
- Theoretical Study of Epitaxial Graphene Growth on SiC(0001) Surfaces
- Contact Conductance Measurement of Locally Suspended Graphene on SiC
- Observation of Band Gap in Epitaxial Bilayer Graphene Field Effect Transistors
- Tight-Binding Approach to Initial Stage of the Graphitization Process on a Vicinal SiC Surface
- Atomic Structure and Physical Properties of Epitaxial Graphene Islands Embedded in SiC(0001) Surfaces
- Theoretical study on magnetoelectric and thermoelectric properties for graphene devices (Selected topics in applied physics: Technology, physics, and modeling of graphene devices)
- Magnetism of Single-Walled Carbon Nanotube with Pd Nanowire(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- A Theoretical Investigation of the Potential for Infer-Surface Migration of Ga Adatoms between GaAs(001) and (111)B Surfaces
- A Method for Calculating Momentum Matrix Elements with Pseudopotentials
- Universal Theory of Si Oxidation Rate Taking Account of Interfacial Si Emission
- First-Principles Study of the Oxide Growth Process on Silicon Surfaces and at Silicon-Oxide/Silicon Interfaces
- Theoretical Study on Epitaxial Graphene Growth by Si Sublimation from SiC(0001) Surface
- Electrical Characterization of Bilayer Graphene Formed by Hydrogen Intercalation of Monolayer Graphene on SiC(0001) (Special Issue : Solid State Devices and Materials (1))
- Ferromagnetism of Manganese–Silicide Nanopariticles in Silicon
- Theoretical Investigation of Oxygen Diffusion in Compressively Strained High-Density $ \alpha $-Quartz
- First-Principles Analyses of O2 Molecules around Ultrathin SiO2/Si(100) Interface
- Effect of Nitrogen on Diffusion in Silicon Oxynitride
- Study on Thermoelectric Properties of Graphene
- The Effect of Partial Pressure of Oxygen on Self-Diffusion of Si in SiO2
- Graphene-Based Nano-Electro-Mechanical Switch with High On/Off Ratio
- Stress Dependence of Oxidation Reaction at SiO2/Si Interfaces during Silicon Thermal Oxidation
- Oxygen Trap Hypothesis in Silicon Oxide
- Effect of Si/SiO2 Interface on Silicon and Boron Diffusion in Thermally Grown SiO2
- Transport Mechanism of Interfacial Network Forming Atoms during Silicon Oxidation
- Origin of Schottky Barrier Modification by Hydrogen on Diamond
- First-Principles Calculations of Uniaxial Strain Effects on Manganese in Silicon
- Charge-Injection Effects in a Single 4,4$''$-Terphenyldithiol Molecule
- The Effect of Chlorine on Silicon Oxidation: Simulation based on the Interfacial Silicon Emission Model
- Quantum Hall Effect and Carrier Scattering in Quasi-Free-Standing Monolayer Graphene
- Graphene-Based Nano-Electro-Mechanical Switch with High On/Off Ratio