Fujiwara Akira | Ntt Basic Research Laboratories Ntt Corporation

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著作論文

Novel-Functional Single-Electron Devices Using Silicon Nanodot Array
Fabrication of double-dot single-electron transistor in silicon nanowire
Novel-Functional Single-Electron Devices Using Silicon Nanodot Array
Fabrication of double-dot single-electron transistor in silicon nanowire
Single-Electron-Resolution Electrometer Based on Field-Effect Transistor(Session4B: Emerging Devices II)
Single-Electron-Resolution Electrometer Based on Field-Effect Transistor(Session4B: Emerging Devices II)
Capacitive Parameter Extraction for Nanometer-Size Field-Effect Transistors
Transfer and Detection of Single Electrons Using Metal-Oxide-Semiconductor Field-Effect Transistors(Emerging Devices,Fundamentals and Applications of Advanced Semiconductor Devices)
Multifunctional Boolean Logic Using Single-Electron Transistors(New System Paradigms for Integrated Electronics)
A Merged Single-Electron Transistor and Metal-Oxide-Semiconductor Transistor Logic for Interface and Multiple-Valued Functions
A Merged SET-MOSFET Logic for Interface and Multiple-Valued Functions
Voltage Gain of Si Single-Electron Transistor and Analysis of Performance of n-Metal-Oxide-Semiconductor Type Inverter with Resistive Load
Single-Electron Detection in Si-Wire Transistors at Room Temperature
Si Single-Electron Devices : Recent Attempts towards High Performance and Functionality
A Si Memory Device Composed of a One-Dimensional Metal-Oxide-Semiconductor Field-Effect-Transistor Switch and a Single-Electron-Transistor Detector
Sub-10-nm Overlay Accuracy in Electron Beam Lithography for Nanometer-Scale Device Fabrication
Suppression of Unintentional Formation of Parasitic Si Islands on a Si Single-Electron Transistor by the Use of SiN Masked Oxidation
Nanoampere charge pumping by single-electron ratchet using Si nanowire MOSFETs
Microscopic Observations of Single-Electron Island in Si Single-Electron Transistors
Threshold Voltage of Si Single-Electron Transistor
Nanometrology of Si Nanostructures Embedded in SiO_2 using Scanning Electron Microscopy
Electrical Characterization of Terphenyl-Based Molecular Devices
Mechanism of Single-Charge Detection using Electron-Hole System in Si-wire Transistors
Single-Electron Stochastic Resonance Using Si Nanowire Transistors
Effect of Arrangement of Input Gates on Logic Switching Characteristics of Nanodot Array Device
Nanowire Metal-Oxide-Semiconductor Field-Effect Transistors with Small Subthreshold Swing Driven by Body-Bias Effect
Ferromagnetism of Manganese–Silicide Nanopariticles in Silicon
Suppression of Effects of Parasitic Metal-Oxide-Semiconductor Field-Effect Transistors on Si Single-Electron Transistors
Back-Gate Effect on Coulomb Blockade in Silicon-on-Insulator Trench Wires
Single-Electron-Resolution Electrometer Based on Field-Effect Transistor
Analysis of Back-Gate Voltage Dependence of Threshold Voltage of Thin Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistor and Its Application to Si Single-Electron Transistor
The Effect of Partial Pressure of Oxygen on Self-Diffusion of Si in SiO2
Threshold Voltage of Si Single-Electron Transistor
Low-Energy Electron Emission from an Electron Enversion Layer of a Si/SiO2/Si Cathode for Nano-Decomposition
Microscopic Observations of Single-Electron Island in Si Single-Electron Transistors
Nanometrology of Si Nanostructures Embedded in SiO2 using Scanning Electron Microscopy

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