Theoretical Study of Excess Si Emitted from Si-oxide/Si Interfaces
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-12-15
著者
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AKIYAMA TORU
Department of Orthopaedic Surgery, Faculty of Medicine, The University of Tokyo
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KAGESHIMA Hiroyuki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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Akiyama Toru
Department Of Physics Engineering Mie University
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Akiyama Toru
Mie Univ. Tsu Jpn
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Akiyama Toru
Department Of Orthopaedic Surgery Faculty Of Medicine The University Of Tokyo
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KAGESHIMA Hiroyuki
NTT LSI Laboratories
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UEMATSU Masahi
NTT Basic Research Laboratories, NTT Corporation
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AKAGI Kazuto
Department of Physics, University of Tokyo
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TSUNEYUKI Shinji
Department of Physics, University of Tokyo
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SHIRAISHI Kenji
Department of Physics, University of Tsukuba
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Kageshima Hiroyuki
Ntt Basic Research Laboratories Ntt Corporation
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Kageshima Hiroyuki
Ntt Basic Research Laboratories
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Akagi Kazuto
Department Of Physics University Of Tokyo
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Uematsu Masahi
Ntt Basic Research Laboratories Ntt Corporation
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Tsuneyuki Shinji
Department Of Physics University Of Tokyo
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Shiraishi Kenji
Department Of Physics Faculty Of Science And Technology Keio University
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Shiraishi Kenji
Department Of Physics University Of Tsukuba
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