Crystal Structure Analysis of Epitaxial BiFeO3–BiCoO3 Solid Solution Films Grown by Metalorganic Chemical Vapor Deposition

概要

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Epitaxial (001)-oriented ($1-x$)BiFeO3–$x$BiCoO3 solid solution films with $x = 0--0.33$ were grown on (100)SrTiO3 substrates at 700 °C by metalorganic chemical vapor deposition. The crystal structure of the films was characterized by high-resolution X-ray diffraction analysis and Raman spectroscopy. Unit cell volume and the lattice parameter were changed with increasing $x$. The BiFeO3 film with $x = 0$ has rhombohedral symmetry and those with $x = 0.16$ and 0.21 have a mixture of rhombohedral and tetragonal symmetries. Finally, tetragonal symmetry was observed for the film with $x = 0.33$ together with a small amount of the contamination phase. This result suggests that the symmetry of ($1-x$)BiFeO3–$x$BiCoO3 films changed from rhombohedral to tetragonal with increasing $x$ similarly to Pb(Zr,Ti)O3 having a large piezo response.
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
2007-10-30