Quantitative Effects of Preferred Orientation and Impurity Phases of Ferroelectric Properties of SrBi_2(Ta_<1-x>Nb_x)_2O_9 Thin Films Measured by X-Ray Diffraction Reciprocal Space Mapping

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 2003-02-15

著者

• FUNAKUBO Hiroshi

  Department of Innovative and Engineered Materials, Interdisciplinary Graduate School, Tokyo Institut

• MITSUYA MASATOSHI

  Department of Radiology, Tohoku University School of Medicine

• SAITO Keisuke

  Application Laboratory

• Funakubo Hiroshi

  Department Of Innovative And Engineered Materials

• YAMAJI Isao

  PANalytical

• AKAI Takao

  PANalytical

• Saito K

  Application Laboratory Panalytical

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