Degradation-free dielectric property using bismuth layer-structured dielectrics having natural superlattice structure(<Special Article>The 62th CerSJ Awards for Academic Achievement in Ceramic Science and Technology)
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概要
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Degradation -free dielectric property was obtained by using films of bismuth layer-structured dielectrics (BLSDs) having a natural superlattice structure. Investigation of the effects of the stack direction of the bismuth oxide and pseudoperovskite layers on the dielectric properties of c-axis-oriented epitaxial BLSD films revealed that those with an even number of octahedra in the pseudoperovskite layer did not show significant degradation in the dielectric constant and retained good insulating characteristics when the film thickness was decreased despite the increased strain applied to the film. This was found not only in epitaxially grown films but also in one-axis-oriented ones with in-plane random orientation. In addition, films with a-/b-axis-oriented epitaxial BLSDs can be used a mold with a periodic nano-structure.
- 社団法人日本セラミックス協会の論文
- 2008-12-01
著者
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FUNAKUBO Hiroshi
Department of Innovative and Engineered Materials, Interdisciplinary Graduate School, Tokyo Institut
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Funakubo Hiroshi
Department Of Innovative And Engineered Materials
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Funakubo Hiroshi
Dep. Of Innovative And Engineered Materials Tokyo Inst. Of Technol.
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