Interface Microstructure of MgB2/Al–AlOx/MgB2 Josephson Junctions Studied by Cross-Sectional Transmission Electron Microscopy
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概要
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We investigated the interface microstructure of sandwich-type MgB2/Al–AlOx/MgB2 Josephson tunnel junctions by cross-sectional transmission electron microscopy (TEM) in order to clarify the non-idealities in the junction characteristics. The results indicate that there are poor-crystalline MgB2 layers and/or amorphous Mg–B composite layers of a few nanometers between the AlOx barrier and upper MgB2 layer. The poor-crystalline upper Mg–B layers seem to behave as normal metal or deteriorated superconducting layers, which may be the principal reason for all non-idealities of our MgB2/Al–AlOx/MgB2 junctions.
- 2007-04-25
著者
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Saito Shiro
NTT Basic Research Laboratories
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Semba Kouichi
NTT Basic Research Laboratories
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Naito Michio
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Makimoto Toshiki
Ntt Basic Laboratories Ntt Corporation
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Ueda Kenji
Ntt Basic Research Laboratories Ntt Corporation
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Naito Michio
Department of Applied Physics, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, Tokyo 184-8588, Japan
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Makimoto Toshiki
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Semba Kouichi
NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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